Off-chip protection: Shunting of ESD current by metal fingers on integrated circuits and printed circuit boards

A novel method for RF device's contact test

“…3(b). At a given frequency (ω), this series configuration can be transformed to the parallel configuration [6]. The quality factor (Q) is defined as Equation 1a.…”

Enhancement of radio frequency device's contact test using a novel method

“…At a given frequency ( ω ), this series configuration can be transformed to the parallel configuration (see Fig. 5 b ) [16]. The quality factor ( Q ) is defined as (1a).…”

“…Numerical validation a Equivalent circuit model of the evaluated PCB for numerical validation. The equivalent circuit model includes: (i) the circuit model of the LNA based on the ADS2009 simulator in chipset under test, (ii) a parallel RC network to represent the ESD protection diode, (iii) a microstrip transmission line and (iv) a resistance of R_pogo pin series with a π‐network to present the pogo pin b Simplified RF modelling of ESD protection devices and its parallel configuration [16]…”

“…The simple RC model in Fig. 5 b [16] is suitable for most ESD devices, especially for the diode structures. More sophisticated models may be required to deal with more complex devices.…”