1991
DOI: 10.1038/352608a0
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Observation of speckle by diffraction with coherent X-rays

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Cited by 372 publications
(215 citation statements)
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“…A coherent beam illuminating a partially ordered system (in our case consisting of SDW/CDW domains) produces an interference pattern, also known as speckle [9,10]. Due to the high sensitivity of speckle to minute changes in domain wall configuration, the time variation of the speckle pattern directly reveals the dynamics of domain structure.…”
mentioning
confidence: 99%
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“…A coherent beam illuminating a partially ordered system (in our case consisting of SDW/CDW domains) produces an interference pattern, also known as speckle [9,10]. Due to the high sensitivity of speckle to minute changes in domain wall configuration, the time variation of the speckle pattern directly reveals the dynamics of domain structure.…”
mentioning
confidence: 99%
“…where I(τ ) and I(τ +t) are the intensities in a given pixel for frames taken at times τ and τ +t respectively, F(Q,t) is the intermediate scattering function, A describes the beam coherence [9,10], and the averaging is performed over times τ and pixels. …”
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confidence: 99%
“…This technique called x-ray photon correlation spectroscopy (XPCS) gives rise to new insights into the structure and its dynamics. In coherent scattering experiments, disorder leads to speckles in the measured scattering intensities 13 , and the observation of changes in the speckle pattern reflects the microscopic time evolution of the fluctuations.…”
Section: )mentioning
confidence: 99%
“…13 . This technique called x-ray photon correlation spectroscopy (XPCS) gives rise to new insights into the structure and its dynamics.…”
Section: )mentioning
confidence: 99%
“…Details of the beamline can be found elsewhere (2). So far, only pinhole sefips are "used routinely in x-ray speckle experiments (3,4 …”
Section: () =mentioning
confidence: 99%