2008
DOI: 10.1016/j.jpcs.2007.07.067
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Observation of room temperature negative differential resistance (NDR) in organic light-emitting diode with inorganic dopant

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Cited by 13 publications
(2 citation statements)
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“…In 2008 Fanga et al demonstrated negative-differential-resistance (NDR) with high peak-to-valley current ratios ( i.e. , larger than 5) in Al/Alq3 structures at room temperature [ 6 ]. In 2000 Gamage et al reported that based on measurements in micro machined silicon flow sensors, the operation in the NDR regime results in increased sensitivity compared to operation in the saturation regime.…”
Section: Introductionmentioning
confidence: 99%
“…In 2008 Fanga et al demonstrated negative-differential-resistance (NDR) with high peak-to-valley current ratios ( i.e. , larger than 5) in Al/Alq3 structures at room temperature [ 6 ]. In 2000 Gamage et al reported that based on measurements in micro machined silicon flow sensors, the operation in the NDR regime results in increased sensitivity compared to operation in the saturation regime.…”
Section: Introductionmentioning
confidence: 99%
“…Figure 2 (a) shows the J-V characteristics of the devices annealed at different annealing times. The anomalous J-V characteristic is observed at low driven voltage range from 2.5 to 6V is called negative differential resistance (NDR) which is related to guest-hopping sites (GHS) and phonon scattering which occur in blend OLED system [11]. The NDR characteristic of the as-cast blend OLED observed to be shifted towards higher driven voltage.…”
Section: Resultsmentioning
confidence: 99%