Procedia Technology
 2014
DOI: 10.1016/j.protcy.2014.08.029
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Oblique Angle Sputtering of Chalcogenide Thin Absorbing Film

Pradeep Kumar Mishra
1
,
V. Dave
2
,
J.N. Prasad
3
et al.
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Cited by 4 publications
(1 citation statement)
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“…Dislocation density ( δ ) signifies the number of defects existing in the CIGSe crystals and was calculated using the following formula: 43 …”
Section: Resultsmentioning
confidence: 99%

Impact of selenization with NaCl treatment on the physical properties and solar cell performance of crack-free Cu(In,Ga)Se2 microcrystal absorbers

Marasamy,
Rasu Chettiar,
Manisekaran
et al. 2024
RSC Adv.
2
0
0
0
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“…Dislocation density ( δ ) signifies the number of defects existing in the CIGSe crystals and was calculated using the following formula: 43 …”
Section: Resultsmentioning
confidence: 99%

Impact of selenization with NaCl treatment on the physical properties and solar cell performance of crack-free Cu(In,Ga)Se2 microcrystal absorbers

Marasamy,
Rasu Chettiar,
Manisekaran
et al. 2024
RSC Adv.
2
0
0
0
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RF sputtering deposited a-IGZO films for LCD alignment layer application

Wu
1
,
Liu
2
,
Sahoo
3
2015
Applied Surface Science
35
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8
0
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Influence of RF power on performance of sputtered a-IGZO based liquid crystal cells

Wu
1
,
Sahoo
2
,
Liu
3
2015
Thin Solid Films
8
0
1
0
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