Numerically Robust Methodology for Fitting Current-Voltage Characteristics of Solar Devices with the Single-Diode Equivalent-Circuit Model

Zinßer, Mario

doi:10.48550/arxiv.2206.13087

Cited by 1 publication

(1 citation statement)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Using the total generated current I out = ∑ k I k net , the power conversion efficiency (PCE) can be computed via where V MPP op is the operating voltage at the maximum power point (MPP), P MPP out is the produced power, and P in is the power of all incident photons. The resulting IV curves are fitted by a numerically robust method [18].…”

Section: Electrical Finite Element Simulationmentioning

confidence: 99%

Irradiation-dependent topology optimization of metallization grid patterns and variation of contact layer thickness used for latitude-based yield gain of thin-film solar modules

et al. 2022

Self Cite

View full text Add to dashboard Cite

We show that the concept of topology optimization for metallization grid patterns of thin-film solar devices can be applied to monolithically integrated solar cells. Different irradiation intensities favor different topological grid designs as well as a different thickness of the transparent conductive oxide (TCO) layer. For standard laboratory efficiency determination, an irradiation power of $$1000\,\mathrm {W/m}^2$$ 1000 W / m 2 is generally applied. However, this power rarely occurs for real-world solar modules operating at mid-latitude locations. Therefore, contact layer thicknesses and also lateral grid patterns should be optimized for lower irradiation intensities. This results in material production savings for the grid and TCO layer of up to 50 % and simultaneously a significant gain in yield of over $$1\,\%$$ 1 % for regions with a low annual mean irradiation. Graphical Abstract

show abstract

Section: Electrical Finite Element Simulationmentioning

confidence: 99%