2008
DOI: 10.1016/j.renene.2007.05.027
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Numerical simulation of the impurity photovoltaic effect in silicon solar cells

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Cited by 38 publications
(18 citation statements)
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“…Alternatively (and probably with higher accuracy), AL can be calculated, according to a modified Shockley-Read-Hall model that involves the generation-recombination process through inserted deep levels [16,18].…”
Section: Numerical Simulation Methods and Device Parametersmentioning
confidence: 99%
“…Alternatively (and probably with higher accuracy), AL can be calculated, according to a modified Shockley-Read-Hall model that involves the generation-recombination process through inserted deep levels [16,18].…”
Section: Numerical Simulation Methods and Device Parametersmentioning
confidence: 99%
“…In a second step, the electron is excited from there to the conduction band by a second photon with energy hν 2 . The net recombination rate U via impurity is given by 2, 6 where n and p are the electron and hole concentrations, and where τ n0 and τ p0 are the lifetimes for electrons and holes, c n and c p are the electron and hole capture coefficients, N t is the impurity concentrations, n 1 and p 1 are the electron and hole concentrations when the Fermi level coincides with the impurity level, E t is the impurity energy level, E C and E V are the conduction and valence band edges, N C and N V are the effective densities of states in the conduction and valence bands, g nt and g pt are the optical emission rates from the impurity for electrons and holes, and $\sigma _{{\rm n}}^{{\rm opt}} $ and $\sigma _{{\rm p}}^{{\rm opt}} $ are the electron and hole optical emission cross‐sections of the impurity. In Eqs.…”
Section: Methodologiesmentioning
confidence: 99%
“…The electron and hole capture coefficients are set as 1.2 × 10 −8 and 1 × 10 −15 cm 3 /s 1 11, 15, 16, respectively. The basic parameters used for the IPV Si solar cell at 300 K are listed in Table 1 2, 4, 6, 12. The electron and hole photoemission cross sections of the Mg impurities are calculated according to the model of Lucovsky 17.…”
Section: Methodologiesmentioning
confidence: 99%
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