2015
DOI: 10.1109/jphotov.2015.2455346
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Numerical Simulation of Carrier-Selective Electron Contacts Featuring Tunnel Oxides

Abstract: Recently, n-type Si solar cells featuring tunnel-oxidepassivated contacts have achieved remarkable conversion efficiencies of up to 24.9%. Different approaches concerning the doped Si layer, which can be amorphous, polycrystalline, or partially crystalline, have been presented over the past few years. In this paper, carrier-selective electron contacts featuring tunnel oxides are investigated by means of numerical device simulation. The influence of 1) the Si layer material, 2) the Si layer doping, 3) an additi… Show more

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Cited by 98 publications
(58 citation statements)
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“…As shown in Figure , the in‐diffusion of phosphorus increased in accordance with an increase in the annealing time for both poly‐Si passivating contacts. This indicates that the deterioration of the lifetime could be due to the phosphorus in‐diffusion into substrate . In addition, when compared with the POCl 3 ‐doped poly‐Si and in situ P‐doped poly‐Si, the in situ P‐doped poly‐Si exhibited a lower in‐diffusion and higher doping concentration within the poly‐Si layer.…”
Section: Resultsmentioning
confidence: 98%
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“…As shown in Figure , the in‐diffusion of phosphorus increased in accordance with an increase in the annealing time for both poly‐Si passivating contacts. This indicates that the deterioration of the lifetime could be due to the phosphorus in‐diffusion into substrate . In addition, when compared with the POCl 3 ‐doped poly‐Si and in situ P‐doped poly‐Si, the in situ P‐doped poly‐Si exhibited a lower in‐diffusion and higher doping concentration within the poly‐Si layer.…”
Section: Resultsmentioning
confidence: 98%
“…An increase in the annealing time and temperature may result in a gettering effect, given that impurity defects are gettered at the poly‐Si layer. In addition, increasing the annealing temperature affected the sheet resistance, as shown in Figure B, which means that the increased lifetime can also be affected by a change of the doping concentration profile, because the doping concentration at poly‐Si and c‐Si determines the tunneling current and carrier selectivity . However, upon a further increase in the annealing time, the lifetimes of both POCl 3 ‐doped poly‐Si and in situ P‐doped poly‐Si decreased.…”
Section: Resultsmentioning
confidence: 98%
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“…With the presence of silicon oxide between SnO 2 and Si, the tunnelling mechanism is enabled with the same approach delineated in ref. 41.…”
Section: Electrical Simulationsmentioning
confidence: 99%
“…Some other applications of MIS devices have been mentioned in the introduction of author"s earlier article [3]. More recently, numerical simulation of a passivated emitter solar cell is performed [4] and an MIS photoanode finds use in artificial photosynthesis experiment of water-splitting where the thin tunnel oxide protects the Si from corrosion due to evolving O 2 at the anode [5]. MIS devices are also used in internal photoemission experiments to determine band offsets of MIS interfaces [6] in which the applied field across the insulator can be corrected by the flatband voltage [7].…”
Section: Introductionmentioning
confidence: 99%