2023
DOI: 10.1038/s41598-023-37486-2
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Numerical optimization and performance evaluation of ZnPC:PC70BM based dye-sensitized solar cell

Abstract: The increase in global energy consumption and the related ecological problems have generated a constant demand for alternative energy sources superior to traditional ones. This is why unlimited photon-energy harnessing is important. A notable focus to address this concern is on advancing and producing cost-effective low-loss solar cells. For efficient light energy capture and conversion, we fabricated a ZnPC:PC70BM-based dye-sensitized solar cell (DSSC) and estimated its performance using a solar cell capacita… Show more

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Cited by 21 publications
(14 citation statements)
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References 64 publications
(51 reference statements)
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“…The consequences of an increase in volume defects of the MoSe 2 window layer within the limit of 10 11 to 10 17 cm −3 have been discussed with the help of figure 6(b). It is observed in figure 6(b) that J sc , V oc, and FF are almost constant up to a certain defect density of 10 14 cm −3 , after that all the parameters are drastically dropped as a result, the efficiency is considerably decreased from 27.6 to 15.9%, which is originated from the Shockley-Read-Hall (SRH) recombination due to traps inside the MoSe 2 window layer [35].…”
Section: Resultsmentioning
confidence: 99%
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“…The consequences of an increase in volume defects of the MoSe 2 window layer within the limit of 10 11 to 10 17 cm −3 have been discussed with the help of figure 6(b). It is observed in figure 6(b) that J sc , V oc, and FF are almost constant up to a certain defect density of 10 14 cm −3 , after that all the parameters are drastically dropped as a result, the efficiency is considerably decreased from 27.6 to 15.9%, which is originated from the Shockley-Read-Hall (SRH) recombination due to traps inside the MoSe 2 window layer [35].…”
Section: Resultsmentioning
confidence: 99%
“…These parasitic losses can be able to impact on J-V behavior of solar cells. The origin of series resistance, Rs, is electrical resistance related to the bulk resistance of the semiconductors (ETL, BSF, and absorber layer), the contact between metal and semiconductor and the resistance of the metal [35,40]. Rs has little impact on V oc but mainly affects FF and PCE due to decreasing the V mp as well.…”
Section: Resultsmentioning
confidence: 99%
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“…Finding the optimal ETL thickness to achieve the highest PCE is crucial. Excessive thickness can hinder light absorption by the absorber layer, reducing photogenerated carriers [37]. In this context, an ETL thickness of 130 nm demonstrates superior performance.…”
Section: Optimization Of Htl and Etlmentioning
confidence: 99%