2000
DOI: 10.1109/16.841221
|View full text |Cite
|
Sign up to set email alerts
|

Numerical modeling of energy balance equations in quantum well Al/sub x/Ga/sub 1-x/As/GaAs p-i-n photodiodes

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
6
0

Year Published

2000
2000
2014
2014

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 16 publications
(6 citation statements)
references
References 22 publications
0
6
0
Order By: Relevance
“…70 Unlike low energy electrons, hot carriers that would have sufficient energy to avoid being trapped by the mid gap states created by these defects. Fardi et al 71 saw evidence for this in AlGaAs/GaAs p-i-n photodiodes. They found that hot carriers were much more likely to avoid SRH recombination, allowing them to escape quantum well layers and be injected into adjacent layers.…”
Section: Mechanisms For Photo-assisted Etchingmentioning
confidence: 94%
“…70 Unlike low energy electrons, hot carriers that would have sufficient energy to avoid being trapped by the mid gap states created by these defects. Fardi et al 71 saw evidence for this in AlGaAs/GaAs p-i-n photodiodes. They found that hot carriers were much more likely to avoid SRH recombination, allowing them to escape quantum well layers and be injected into adjacent layers.…”
Section: Mechanisms For Photo-assisted Etchingmentioning
confidence: 94%
“…The expression for the direct kinetic energy exchange among the electron and hole carriers is based on the effective mass approximation due to optical generation for electron and holes in the bulk described in detail in articles [14,15]. The details of the device modeling and the formulations are also discussed in our previous work published in [16,17]. order to reflect unabsorbed photons from the GaAs/AlGaAs QW junction.…”
Section: Device Modelingmentioning
confidence: 99%
“…We will assume fast thermalization of the charge carriers with the lattice, neglecting hot electron effects, considered in Refs. [15,16].…”
Section: Introductionmentioning
confidence: 99%