1993
DOI: 10.1016/0038-1101(93)90083-3
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Numerical modeling of abrupt heterojunctions using a thermionic-field emission boundary condition

Abstract: We present a numerical model in which the thermionic and tunneling mechanisms across an abrupt heterojunction interface are taken into account on the basis of the one dimensional drift-diffusion formulation.We use an expression of thermionic-field emission current formulated based on the WKB approximation as a boundary condition at the abrupt heterointerface which eventually limits the current transport over the barrier while maintaining the current continuity. The I-V characteristics of three types of GaAs/Al… Show more

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Cited by 172 publications
(90 citation statements)
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“…Whereas in heterojunctions, I-V characteristic depends also on thermionic emission across the interface in low doping level and the tunnel current in high-doped semiconductors. Several authors have proposed and verified models on conduction mechanism in heterojunctions (Chang 1965;Yang et al 1993;Bhapkar and Mattauch 1993;Horio and Yanai 1990;Cavallini and Polenta 2008), which are similar to thermionic emission and diffusion model proposed by Sze and Crowell for a metal-semiconductor junction (Crowell and Sze 1966). Hence, the I-V characteristics of p-CdTe/n-ZnSe heterojunction have general form…”
Section: Electrical Characterizationmentioning
confidence: 69%
“…Whereas in heterojunctions, I-V characteristic depends also on thermionic emission across the interface in low doping level and the tunnel current in high-doped semiconductors. Several authors have proposed and verified models on conduction mechanism in heterojunctions (Chang 1965;Yang et al 1993;Bhapkar and Mattauch 1993;Horio and Yanai 1990;Cavallini and Polenta 2008), which are similar to thermionic emission and diffusion model proposed by Sze and Crowell for a metal-semiconductor junction (Crowell and Sze 1966). Hence, the I-V characteristics of p-CdTe/n-ZnSe heterojunction have general form…”
Section: Electrical Characterizationmentioning
confidence: 69%
“…The local potential distribution can be controlled by an external potential, such as the gate voltage [13,14] which requires additional structure, but here we employ the band discontinuity of the heterojunction [15,16]. The bandgap discontinuity is controlled by alloying (here Al composition), and in particular the discontinuity in the conduction band (∆E e,c ) is the potential barrier with height ϕ b for the electrons.…”
Section: Sorptionmentioning
confidence: 99%
“…To do so, we use a model used in physical engineering literature [18,19], which does not have the same "DDM-like" formulation as that given for potential equation by (46) and (47)…”
Section: Continuity Equation At Heterojunctionmentioning
confidence: 99%
“…Finally, we mention that in some works [18] the continuity equation on the interface extending (49) may account for additional interface phenomena, i.e., interface traps, via additional right-hand-side interface terms active only in Ω I , i.e., at I. We do not consider these here.…”
Section: Continuity Equation At Heterojunctionmentioning
confidence: 99%
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