“…At present, Novolac-diazonaphthoquinone (DNQ) systems are the main photoresist of the most used i-line positive photoresist . Under UV irradiation, the DNQ undergoes Wolff rearrangement to generate ketene, which is further transformed into indene carboxylic acid, promoting the dissolution of Novolac in the developer. , Other major photoresists include chemical amplified resists (CAR), molecular glass photoresists, photodegradable polymers, and so on, which have been used in G-line, I-line, KrF, ArF, and EUV lithography. − Since the concept of “chemical amplification” was proposed by Hiroshi Ito and colleagues, it has become the paradigm of advanced 248 and 193 nm resist systems . To ensure the excellent resolution and process stability of photoresist when applied to mass production, excellent film-forming, etching resistance, thermal stability, suitable viscosity, low shrinkage, low thermal expansion coefficient, and swelling properties must be taken into consideration.…”