Novel Industry Ready Sensors for Shape Measurement Based on Multi Wavelength Digital Holography

Algebraic solution for phase unwrapping problems in multiwavelength interferometry

“…This is achieved without the need for closely separated measurement wavelengths. The results of this work have numerous applications in absolute distance metrology [20,21,[27][28][29], discrete wavemeters [30,31], and full-field MWI and profilometry techniques [7-9, 22, 24,32], or multi-wavelength digital holography [33][34][35]. Fig.…”

1.1.2 HoloPort - 3D-Sensor for machine tools

“…The previously introduced components are controlled by a microcontroller (9). Energy supply and signal distribution is performed by a specially designed circuit board (10). Since the speed of the sensor system determines the economic efficiency and benefits in the machine tool decisively, a powerful CUDA capable computing unit has been integrated: A Jetson TX2 board (11) allows not only wireless data transfer according to the state of the art, but also allows data reduction inside the sensor itself.…”

Absolute phase recovery in structured light illumination systems: Sinusoidal vs. intensity discrete patterns

“…One important area is optical metrology [7][8][9] where the absolute phase measurement (or optical path difference) can directly be related to a physical quantity that commonly refers to lengths or heights in industrial applications [10]. However, the calculation of the absolute phase using a series of wrapped phase maps obtained under different measurement wavelengths is an age old problem in multi-wavelength interferometry [1,[11][12][13].…”