2021
DOI: 10.1007/s40145-021-0487-9
|View full text |Cite
|
Sign up to set email alerts
|

Novel hierarchical structure of MoS2/TiO2/Ti3C2Tx composites for dramatically enhanced electromagnetic absorbing properties

Abstract: In order to prevent the microwave leakage and mutual interference, more and more microwave absorbing devices are added into the design of electronic products to ensure its routine operation. In this work, we have successfully prepared MoS2/TiO2/Ti3C2Tx hierarchical composites by one-pot hydrothermal method and focused on the relationship between structures and electromagnetic absorbing properties. Supported by comprehensive characterizations, MoS2 nanosheets were proved to be anchored on the surface and interl… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
30
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
8

Relationship

3
5

Authors

Journals

citations
Cited by 111 publications
(35 citation statements)
references
References 39 publications
(41 reference statements)
0
30
0
Order By: Relevance
“…[ 17 ] Generally, it is impedance matching level between materials and free space that controls the reflection; while permittivity and permeability of materials determine the absorption. To evaluate the microwave (MW) absorption performance of the as‐synthesized Ti 3 C 2 T x ‐based absorbers, the reflection loss (RL) values were calculated according to transmission line theory: [ 29 ] RLbadbreak=20log10|(Zinbadbreak−Z0)normal/(Zinbadbreak+Z0)|\[ \begin{array}{*{20}{c}}{{\rm{RL}} = 20{{\log }_{10}}\left| {\left( {{Z_{{\rm{in}}}} - {Z_0}} \right){\rm{/}}\left( {{Z_{{\rm{in}}}} + {Z_0}} \right)} \right|}\end{array} \] Zinbadbreak=Z0μnormalrεnormalrtanh(j2πfdμrεrc)\[ \begin{array}{*{20}{c}}{{Z_{{\rm{in}}}} = {Z_0}\sqrt {\frac{{{\mu _{\rm{r}}}}}{{{\varepsilon _{\rm{r}}}}}} \tanh \left( {j\frac{{2\pi fd\sqrt {{\mu _{\rm{r}}}{\varepsilon _{\rm{r}}}} }}{c}} \right)}\end{array} \] …”
Section: Resultsmentioning
confidence: 99%
“…[ 17 ] Generally, it is impedance matching level between materials and free space that controls the reflection; while permittivity and permeability of materials determine the absorption. To evaluate the microwave (MW) absorption performance of the as‐synthesized Ti 3 C 2 T x ‐based absorbers, the reflection loss (RL) values were calculated according to transmission line theory: [ 29 ] RLbadbreak=20log10|(Zinbadbreak−Z0)normal/(Zinbadbreak+Z0)|\[ \begin{array}{*{20}{c}}{{\rm{RL}} = 20{{\log }_{10}}\left| {\left( {{Z_{{\rm{in}}}} - {Z_0}} \right){\rm{/}}\left( {{Z_{{\rm{in}}}} + {Z_0}} \right)} \right|}\end{array} \] Zinbadbreak=Z0μnormalrεnormalrtanh(j2πfdμrεrc)\[ \begin{array}{*{20}{c}}{{Z_{{\rm{in}}}} = {Z_0}\sqrt {\frac{{{\mu _{\rm{r}}}}}{{{\varepsilon _{\rm{r}}}}}} \tanh \left( {j\frac{{2\pi fd\sqrt {{\mu _{\rm{r}}}{\varepsilon _{\rm{r}}}} }}{c}} \right)}\end{array} \] …”
Section: Resultsmentioning
confidence: 99%
“…Reflection loss (RL) is an important factor to evaluate the EMW absorption property of the SiC@SiO 2 NFA, which can be calculated by as follows [55,56]: where Z in is the input impedance of the aerogel, f is the frequency, c is the speed of light, d is the thickness of the aerogel, and Z o is the impedance in free space. We know that a RL value of − 10 dB means 90% absorbed of the incident EMW radiation, and the corresponding bandwidth indicates an effective absorption bandwidth (EAB) [57,58].…”
Section: Emw Absorption Performance Of the Sic@sio 2 Nfamentioning
confidence: 99%
“…Experiencing the prosperity of metals and their oxides in the early stage, the industrial community proposes new requirements of "thin, light, wide and strong" for EMW absorbing materials, that is, thin coating thickness, lightweight, wide absorption bandwidth and strong absorption capacity [9][10][11]. Deservedly, researchers place great expectations on the development of dielectric loss EMW absorbing materials, especially carbonaceous materials with low density, strong corrosion resistance, high thermal stability, good electrical conductivity and adjustable dielectric properties [12][13][14]. Meanwhile, carbon materials also have the characteristics of diverse microstructure, convenient utilize, simple maintenance, good compatibility with the matrix material etc., which is incomparable to many materials.…”
Section: Introductionmentioning
confidence: 99%