Novel Fabrication Technique of Suspended Nanowire Devices for Nanomechanical Applications

Tomita, Wataru; Sasaki, Satoshi; Tateno, Kouta; Okamoto, Hajime; Yamaguchi, Hiroshi

doi:10.1002/pssb.201900401

Cited by 6 publications

(2 citation statements)

References 22 publications

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“…The extension to epitaxially engineered nanowires with an optical or electronic functionality would also be available. This would thus allow us to construct novel quantum hybrid cavity optomechanical systems based on, for example, nanowire field-effect transistors and quantum dots [36][37][38][39] , which could lead to highly efficient electrooptic transduction and highly sensitive charge detection through optomechanical coupling 40 . The near-field cavity optomechanical coupling could also be demonstrated at liquid helium temperatures by carefully designing the cryo-measurement setup.…”

Section: Discussionmentioning

confidence: 99%

Near-field cavity optomechanical coupling in a compound semiconductor nanowire

et al. 2020

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A III-V compound semiconductor nanowire is an attractive material for a novel hybrid quantum interface that interconnects photons, electrons, and phonons through a wavelength-tunable quantum structure embedded in its free-standing structure. In such a nanomechanical element, however, a challenge is how to detect and manipulate a small number of phonons via its tiny mechanical motion. A solution would be to couple an optical cavity to a nanowire by introducing the ‘cavity optomechanics' framework, but the typical size difference between them becomes a barrier to achieving this. Here, we demonstrate near-field coupling of a silica microsphere cavity and an epitaxially grown InP/InAs free-standing nanowire. The evanescent optomechanical coupling enables not only fine probing of the nanowire’s mechanical motion by balanced homodyne interferometry but also tuning of the resonance frequency, linewidth, Duffing nonlinearity, and vibration axis in it. Combining this cavity optomechanics with epitaxial nanowire engineering opens the way to novel quantum metrology and information processing.

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Section: Discussionmentioning

confidence: 99%

Near-field cavity optomechanical coupling in a compound semiconductor nanowire

et al. 2020

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“…The extension to epitaxially engineered nanowires with an optical or electronic functionality would also be available. This would thus allow us to construct novel quantum hybrid cavity optomechanical systems based on, for example, nanowire field-effect transistors and quantum dots [35][36][37][38], which could lead to highly efficient electro-optic transduction and highly sensitive charge detection through optomechanical coupling [39]. The near-field cavity optomechanical coupling could also be demonstrated at liquid-helium temperatures by carefully designing the cryo-measurement setup.…”

Section: Discussionmentioning

confidence: 99%

Near-field cavity optomechanical coupling in a compound semiconductor nanowire

Asano¹,

Zhang²,

Tawara³

et al. 2020

Preprint

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A III-V compound semiconductor nanowire is an attractive material for a novel hybrid quantum interface that interconnects photons, electrons, and phonons through a wavelength-tunable quantum structure embedded in its free-standing structure. In such a nanomechanical element, however, a challenge is how to detect and manipulate a small number of phonons via its tiny mechanical motion. A solution would be to couple an optical cavity to a nanowire by introducing the "cavity optomechanics" framework, but the typical size difference between them becomes a barrier to achieving this. Here, we demonstrate near-field coupling of a silica microsphere cavity and an epitaxially grown InP/InAs free-standing nanowire. The evanescent optomechanical coupling enables not only fine probing of the mechanical motion by balanced homodyne interferometry but also tuning of the resonance frequency, linewidth, Duffing nonlinearity, and vibration axis in the nanowire. Combining this cavity optomechanics with epitaxial nanowire engineering opens the way to novel quantum metrology and information processing.

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