Novel correctable testing interface for high speed/frequency device testing

Chuang, Chih-Cheng; Cheng, Kuan-I; Wu, Sung‐Mao; Huang, Lung-Shu; Chiu, Bang-Cheng

doi:10.1109/eptc.2016.7861571

2016 IEEE 18th Electronics Packaging Technology Conference (EPTC) 2016

DOI: 10.1109/eptc.2016.7861571

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Novel correctable testing interface for high speed/frequency device testing

Chih-Cheng Chuang

Kuan-I Cheng

Sung‐Mao Wu

et al.

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Novel correctable testing interface for high speed/frequency device testing

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