2014
DOI: 10.1063/1.4887343
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Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation

Abstract: We present a dynamic strain field mapping method based on synchrotron X-ray digital image correlation (XDIC). Synchrotron X-ray sources are advantageous for imaging with exceptional spatial and temporal resolutions, and X-ray speckles can be produced either from surface roughness or internal inhomogeneities. Combining speckled X-ray imaging with DIC allows one to map strain fields with high resolutions. Based on experiments on void growth in Al and deformation of a granular material during Kolsky bar/gas gun l… Show more

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Cited by 42 publications
(30 citation statements)
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“…Details of XDIC have been given in Ref. [28]. The whole image is chosen as the regions of interest for XDIC analyses.…”
Section: Resultsmentioning
confidence: 99%
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“…Details of XDIC have been given in Ref. [28]. The whole image is chosen as the regions of interest for XDIC analyses.…”
Section: Resultsmentioning
confidence: 99%
“…Dynamic XDIC provides spatially and temporally resolved information as a valuable complement to post-mortem recovery analysis with scanning electron microscope or SEM [7,9]. High-speed synchrotron XDIC has been adopted to explore dynamic deformation of Al, Mg alloys, and granular materials [27,28,32]. However, in situ measurements on dynamic strain fields in B 4 C/Al composites with high-speed XDIC are extremely rare.…”
Section: Introductionmentioning
confidence: 99%
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