2020
DOI: 10.3952/physics.v59i4.4138
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Nonstoichiometric tin oxide films: study by X-ray diffraction, Raman scattering and electron paramagnetic resonance

Abstract: Nonstoichiometric SnO/SnO2/SnO2−δ films were fabricated by DC magnetron sputtering and reactive DC magnetron sputtering of tin target with further 2-stage temperature annealing of synthesized materials. X-ray diffraction analysis, Raman spectroscopy and electron paramagnetic resonance (EPR) spectroscopy were employed to study the influence of oxygen content in the plasma during the sputtering process and the temperature of annealing on the stoichiometric and phase composition of synthesized films. It was found… Show more

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Cited by 4 publications
(2 citation statements)
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References 29 publications
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“…The instrument broadening was not included in the estimation due to its negligible value (0.08 degree) in comparison with the width of the XRD peaks for our polycrystalline samples. Wide peaks due to X-ray diffraction on (310) and (112) planes of the SnO2 tetragonal rutile structure were also detected for samples B and C. It should be noted that increasing oxygen content during the reactive magnetron sputtering process up to a value of about 2 vol % induces the formation of amorphous tin oxide films after following the heat treatment procedure regardless of the annealing temperature [31,33].…”
Section: Resultsmentioning
confidence: 80%
“…The instrument broadening was not included in the estimation due to its negligible value (0.08 degree) in comparison with the width of the XRD peaks for our polycrystalline samples. Wide peaks due to X-ray diffraction on (310) and (112) planes of the SnO2 tetragonal rutile structure were also detected for samples B and C. It should be noted that increasing oxygen content during the reactive magnetron sputtering process up to a value of about 2 vol % induces the formation of amorphous tin oxide films after following the heat treatment procedure regardless of the annealing temperature [31,33].…”
Section: Resultsmentioning
confidence: 80%
“…Tin oxide SnO 2 is widely used for the production of optically transparent conducting materials, gas sensitive sensors and varistors [1][2][3]. One of the important properties of SnO 2 based semiconductor materials is their great sensitivity to the relative air humidity [3][4][5][6][7][8][9][10].…”
Section: Introductionmentioning
confidence: 99%