Nonlinear Optical Technique for Precise Retardation Measurements

Abstract

We present a highly sensitive nonlinear optical technique to measure optical retardation. The technique is based on second-harmonic generation from thin films using two beams at the fundamental frequency. The sensitive polarization dependence of the process allows measuring optical retardation very precisely. The technique relies on fundamental symmetry principles and does therefore not require complicated experimental arrangement or data analysis. The technique was demonstrated by determining the retardation of a nominal half-wave plate to a precision and repeatability better than lambda/10(4).

Measurement method for optical retardation based on the phase difference effect of laser feedback fringes

“…For the high precision measurement methods based on an interferometric system, the complex arrangement and operation is usually required. Besides those traditional ones, some novel methods have been proposed and investigated over the past decades, such as the nonlinear optical method [15], the time-domain method [16], and the laser frequency-splitting (LFS) method [17]. A measurement uncertainty (or sensitivity) of λ∕10 4 [15,17] even λ∕10 6 [16] has been reported.…”

Polarisation control through an optical feedback technique and its application in precise measurements

“…To manufacture high precision wave plates, high precision methods for measuring phase retardation are needed. Some methods for phase retardation measurements have been proposed131415, however, these methods have low precision for multiorder half-wave plates and a careful alignment of several polarisation components is needed. The complicated setups for such experiments and data analysis are also expensive.…”