Nonlinear dynamic perspectives on dynamic force microscopy

Lee, S.I.; Howell, Stephen W.; Raman, Arvind; Reifenberger, R.

doi:10.1016/s0304-3991(03)00043-3

Cited by 92 publications

(56 citation statements)

References 23 publications

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“…When the Z -gap between the CNT AFM probe and sample is further reduced beyond the attractive region, repulsive forces come into play. In such a situation, attractive and repulsive (tapping) solutions can coexist [23]. At C, the probe amplitude and phase jump, signifying a jump from the attractive to repulsive regime.…”

Section: Attractive Regime Imaging Verification Using Amplitude-distamentioning

confidence: 99%

Imaging artefacts in atomic force microscopy with carbon nanotube tips

Strus¹,

Raman²,

Han³

et al. 2005

Nanotechnology

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Dynamic atomic force microscopy (dynamic AFM) with carbon nanotube tips has been suggested as an enabling tool for high precision nanometrology of critical dimension features of semiconductor surfaces. We investigate the performance of oscillating AFM microcantilevers with multi-walled carbon nanotube (multi-walled CNT) tips interacting with high aspect ratio structures while in the attractive regime of dynamic AFM. We present experimental results on SiO 2 gratings and tungsten nanorods, which show two distinct imaging artefacts, namely the formation of divots and large ringing artefacts that are inherent to CNT AFM probe operation. Through meticulous adjustment of operating parameters, the connection of these artefacts to CNT bending, adhesion, and stiction is described qualitatively and explained.

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Section: Attractive Regime Imaging Verification Using Amplitude-distamentioning

confidence: 99%

Imaging artefacts in atomic force microscopy with carbon nanotube tips

Strus¹,

Raman²,

Han³

et al. 2005

Nanotechnology

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“…Secondly, it is assumed that the MWCNT is oriented identically with respect to the sample before each impact 9 . Figure 4(a) illustrates this idea and shows the nominal experimental values of microcantilever slant angle and the halfcone angle of the pyramidal silicon tip to which the MWCNT is attached.…”

Section: Theoretical Analysismentioning

confidence: 99%

Nonlinear tapping dynamics of multi-walled carbon nanotube tipped atomic force microcantilevers

et al. 2004

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The nonlinear dynamics of an atomic force microcantilever (AFM) with an attached multi-walled carbon nanotube (MWCNT) tip is investigated experimentally and theoretically. We present the experimental nonlinear frequency response of a MWCNT tipped microcantilever in the tapping mode. Several unusual features in the response distinguish it from those traditionally observed for conventional tips. The MWCNT tipped AFM probe is apparently immune to conventional imaging instabilities related to the coexistence of attractive and repulsive tapping regimes. A theoretical interaction model for the system using an Euler elastica MWCNT model is developed and found to predict several unusual features of the measured nonlinear response.

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“…One of the most widely used SFM methods for measuring the local mechanical properties of the sample such as adhesion, elasticity, or dissipation is dynamic force microscopy ͑DFM͒. [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16] In DFM, the cantilever probe is driven near its first fundamental resonance and its amplitude and phase are monitored as it approaches or retracts from the sample. Several studies have used force-distance, [17][18][19] frequency shift-distance, 20,21 amplitudedistance, 22 or phase-distance graphs, [23][24][25] to characterize the local mechanical properties of the sample.…”

Section: Introductionmentioning

confidence: 99%

Probing attractive forces at the nanoscale using higher-harmonic dynamic force microscopy

2005

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We systematically investigate higher harmonics in the vibration spectrum of scanning force microscope cantilevers operating in the attractive regime. We show that ͑a͒ the magnitudes of the higher-harmonic signals in the vibration spectrum should be directly correlated to the local van der Waals forces for systems without significant electrostatic interactions and ͑b͒ the higher-harmonic resonances are much sharper than the fundamental harmonic. Consequently, and unlike the case of the tapping mode operation, contrast in the amplitudes of the higher harmonics over a scanned sample with small electrostatic forces reflects changes in specific chemical composition. Dynamic force-distance curves and higher-harmonic images are presented to demonstrate contrast between biological macromolecules deposited on a mica substrate. The results suggest that the systematic measurement of higher harmonics in the attractive regime can lead to highly sensitive techniques to map the chemical composition over heterogeneous samples.

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Nonlinear dynamic perspectives on dynamic force microscopy

Cited by 92 publications

References 23 publications

Imaging artefacts in atomic force microscopy with carbon nanotube tips

Imaging artefacts in atomic force microscopy with carbon nanotube tips

Nonlinear tapping dynamics of multi-walled carbon nanotube tipped atomic force microcantilevers

Probing attractive forces at the nanoscale using higher-harmonic dynamic force microscopy

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