Nonlinear dynamic characterization of two-dimensional materials

Davidovikj, Dejan; Alijani, Farbod; Cartamil-Bueno, Santiago J.; Zant, Herre S. J. van der; Amabili, Marco; Steeneken, Peter G.

doi:10.1038/s41467-017-01351-4

Cited by 119 publications

(129 citation statements)

References 45 publications

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“…Tunability Ω Γ Coupling ωx c u Plasmon in graphene [28][29][30] 0.1 -1 eV 10 THz 0.1 GHz 10 nm 10 −5 0.01 -0.1 Exciton in TMD monolayers [30,31] 2 eV 20 GHz 0. Table I presents an overview of various potential systems in different ranges of electromagnetic spectrum and Fig.…”

Section: Discussionmentioning

confidence: 99%

Optomechanical Kerker Effect

Poshakinskiy

Poddubny

2019

Phys. Rev. X

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Tunable directional scattering is of paramount importance for operation of antennas, routing of light, and design of topologically protected optical states. For visible light scattered on a nanoparticle the directionality could be provided by the Kerker effect, exploiting the interference of electric and magnetic dipole emission patterns. However, magnetic optical resonances in small sub-100-nm particles are relativistically weak. Here, we predict inelastic scattering with the unexpectedly strong tunable directivity up to 5.25 driven by a trembling of small particle without any magnetic resonance. The proposed optomechanical Kerker effect originates from the vibration-induced multipole conversion. We also put forward an optomechanical spin Hall effect, the inelastic polarizationdependent directional scattering. Our results uncover an intrinsically multipolar nature of the interaction between light and mechanical motion. They apply to a variety of systems from cold atoms to two-dimensional materials to superconducting qubits and can be instructive to engineer chiral optomechanical coupling. arXiv:1807.05569v1 [physics.optics]

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Section: Discussionmentioning

confidence: 99%

Optomechanical Kerker Effect

Poshakinskiy

Poddubny

2019

Phys. Rev. X

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“…The remarkable electronic [1,2], thermal [3][4][5] and mechanical [6][7][8] properties of graphene have opened the door for many new electronic devices [9][10][11][12] and sensors [13][14][15][16][17][18][19][20]. Fabrication of these devices on wafer-scale often requires transfer of sheets of single-layer graphene grown by chemical vapor deposition, using a support polymer [21][22][23][24][25][26].…”

Section: Introductionmentioning

confidence: 99%

“…Several works have determined the amount of contamination on top of graphene resonators by tracking the resonance frequency shift in response to an out-of-plane force [9,[36][37][38][39]. However, these methods require knowledge of the mechanical properties of the resonator, which vary considerably from device-to-device, impacting the accuracy of resonance-based measurement methods [7,[43][44][45][46][47]. Moreover, resonance based methods only probe con-tamination over a small area of the suspended resonator, whereas large lateral variations in the amount of contamination can occur.…”

Section: Introductionmentioning

confidence: 99%

Mass measurement of graphene using quartz crystal microbalances

Dolleman

Hsu

Vollebregt

et al. 2019

Applied Physics Letters

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Current wafer-scale fabrication methods for graphene-based electronics and sensors involve the transfer of single-layer graphene by a support polymer. This often leaves some polymer residue on the graphene, which can strongly impact its electronic, thermal, and mechanical resonance properties. To assess the cleanliness of graphene fabrication methods, it is thus of considerable interest to quantify the amount of contamination on top of the graphene. Here, we present a methodology for direct measurement of the mass of the graphene sheet using quartz crystal microbalances (QCM). By monitoring the QCM resonance frequency during removal of graphene in an oxygen plasma, the total mass of the graphene and contamination is determined with sub-graphene-monolayer accuracy. Since the etch-rate of the contamination is higher than that of graphene, quantitative measurements of the mass of contaminants below, on top, and between graphene layers are obtained. We find that polymer-based dry transfer methods can increase the mass of a graphene sheet by a factor of 10. The presented mass measurement method is conceptually straightforward to interpret and can be used for standardized testing of graphene transfer procedures in order to improve the quality of graphene devices in future applications. arXiv:1902.11098v1 [cond-mat.mes-hall]

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“…8,[11][12][13][14][15] Suspended atomically thin graphene structures that include doubly-clamped graphene beams, fully clamped graphene membranes and graphene cantilevers have been extensively studied and 3 have been utilized in electromechanical resonators, [16][17][18][19][20] various types of pressure sensors, 9,[21][22][23][24][25][26][27][28] strain sensors, 29,30 high responsivity photodetectors, 31 NEMS switches, 32 earphones, 33 loudspeakers, 34 microphones 35,36 and other NEMS devices. 7,[37][38][39][40][41][42] NEMS accelerometers and gyroscopes typically require masses that are attached to suspended membranes, beams or cantilevers. However, realizing suspended graphene with large attached proof masses remians challenging.…”

Section: Mems Nems Accelerometersmentioning

confidence: 99%

Suspended Graphene Membranes with Attached Silicon Proof Masses as Piezoresistive Nanoelectromechanical Systems Accelerometers

et al. 2019

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Graphene is an atomically thin material that features unique electrical and mechanical properties, which makes it an extremely promising material for future nanoelectromechanical systems (NEMS). Recently, basic NEMS accelerometer functionality has been demonstrated by utilizing piezoresistive graphene ribbons with suspended silicon proof masses. However, the proposed graphene ribbons have limitations regarding mechanical robustness, manufacturing yield, and the maximum measurement current that can be applied across the ribbons. Here, we report on suspended graphene membranes that are fully clamped at their circumference and have attached silicon proof masses. We demonstrate their utility as piezoresistive NEMS accelerometers, and they are found to be more robust, have longer life span and higher manufacturing yield, can withstand higher measurement currents, and are able to suspend larger silicon proof masses, as compared to the previous graphene ribbon devices. These findings are an important step toward bringing ultraminiaturized piezoresistive graphene NEMS closer toward deployment in emerging applications such as in wearable electronics, biomedical implants, and internet of things (IoT) devices.

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Nonlinear dynamic characterization of two-dimensional materials

Cited by 119 publications

References 45 publications

Optomechanical Kerker Effect

Optomechanical Kerker Effect

Mass measurement of graphene using quartz crystal microbalances

Suspended Graphene Membranes with Attached Silicon Proof Masses as Piezoresistive Nanoelectromechanical Systems Accelerometers

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