Proceeding of the Thirteenth International Symposium on Low Power Electronics and Design - ISLPED '08 2008
DOI: 10.1145/1393921.1394011
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Noninvasive leakage power tomography of integrated circuits by compressive sensing

Abstract: We introduce a new methodology for noninvasive post-silicon characterization of the unique static power profile (tomogram) of each manufactured chip. The total chip leakage is measured for multiple input vectors in a linear optimization framework where the unknowns are the gate leakage variations. We propose compressive sensing for fast extraction of the unknowns since the leakage tomogram contains correlations and can be sparsely represented. A key advantage of our approach is that it provides leakage variati… Show more

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Cited by 19 publications
(13 citation statements)
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References 23 publications
(28 reference statements)
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“…The first one employs direct wafer microscopic measurements [Friedberg et al 2005]. The other set of techniques use nondestructive indirect power and delay measurements and sophisticated techniques for solving systems of overconstrainted system of linear equation in presence of noisy data [Alkabani et al 2008a;Shamsi et al 2008].…”
Section: Related Workmentioning
confidence: 99%
“…The first one employs direct wafer microscopic measurements [Friedberg et al 2005]. The other set of techniques use nondestructive indirect power and delay measurements and sophisticated techniques for solving systems of overconstrainted system of linear equation in presence of noisy data [Alkabani et al 2008a;Shamsi et al 2008].…”
Section: Related Workmentioning
confidence: 99%
“…Calibration is done by transforming and comparing the test IC currents to those produced by Trojanfree simulation models. Gate-level estimation as a method for post-silicon IC characterization has been introduced earlier [2,3,13,9]. Potkonjak et al combined the gate-level estimation with constraint manipulation to detect Trojans using delay and leakage side channels [9].…”
Section: Related Workmentioning
confidence: 99%
“…Li and Lach propose adding on chip delay test structures for Trojan detection [27]. Gate-level characterization was used for postsilicon profiling [28]- [30] and its use for IC Trojan detection was first proposed in [9], [31] and also used in [10]- [13], [32], [33]. However, optimality guarantees (bounds), calibration, sensitivity, and multimodal combining were not discussed in the literature.…”
Section: Related Workmentioning
confidence: 99%