2018
DOI: 10.1109/jsen.2018.2869908
|View full text |Cite
|
Sign up to set email alerts
|

Noncontact RF Voltage Sensing of a Printed Trace via a Capacitive-Coupled Probe

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
7
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
7

Relationship

2
5

Authors

Journals

citations
Cited by 40 publications
(7 citation statements)
references
References 23 publications
0
7
0
Order By: Relevance
“…To prove that the temperature rise is due to the electric field concentrated on the center of the target, we experimentally measure the electric field inside the target material by using a coaxial probe and a VNA [18]. Fig.…”
Section: Simulation and Experiments Resultsmentioning
confidence: 99%
“…To prove that the temperature rise is due to the electric field concentrated on the center of the target, we experimentally measure the electric field inside the target material by using a coaxial probe and a VNA [18]. Fig.…”
Section: Simulation and Experiments Resultsmentioning
confidence: 99%
“…27 (b). There is a maximal order union (6,28) of 0.16% corresponding to the sixth and 28 th marked point frequencies from left to right in Fig. 26 (b).…”
Section: Order Reduced Processing For Multi-sourcementioning
confidence: 97%
“…By considering both the completeness of frequency representation and symmetry of amplitudes unions, if and only if the reference frequency parameters satisfy (28), P × Q = 1.…”
Section: B Oi Of Spectrummentioning
confidence: 99%
See 1 more Smart Citation
“…Several models in the literature are unsuited for such a specific purpose, since the involved near-field probes are used as field sensors, and the objective is to derive equivalent radiated emission sources from near-field measurement [14], [16], [17]. Conversely, if the probes are used for noise injection, probe-to-trace electric coupling can be either modeled through a coupling capacitance [18], [19], [20], or an induced source [5], [21] determined by local-field distribution and field-to-wire coupling [22]. However, these models are inherently influenced by the specific characteristics of both the near-field probe and the trace under test, and therefore developing a new probe model for every test setup is quite time consuming.…”
mentioning
confidence: 99%