Noncontact Atomic Force Microscopy Investigations of Au<sub>55</sub>Thin Films Deposited on Gold and Graphite Substrates

Radu, G.; Mautes, D; Hartmann, Uwe

doi:10.1088/1742-6596/61/1/191

Cited by 4 publications

(2 citation statements)

References 10 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Almost as soon as the technique became available, nc‐AFM was also applied in studies of adsorbed nanoclusters: Au on alumina,193 TiO 2 ,194 NaCl,195 KBr,196–201 RbI,198 mica,202 MoS 2 ,229 poly‐L‐lysine coated mica,203 Si,204 InSb,205 graphite206 and gold;206 Ag on graphite207 and quartz;208 Cu on alumina;209, 210 Pd on alumina209, 211 and MgO(001);212 Ni on alumina;213 Fe on NaCl;214 Fe/Pt on NaCl;214, 215 InAs on GaAs;202 Si on CaF 2 (111);216 and Ge on Si 217, 218. In terms of resolution, many of these studies offered little benefit over contact AFM measurements,219–224 but the extra sensitivity improved the reproducibility of the measurements and reduced unintentional surface damage.…”

Section: Non‐contact Atomic Force Microscopymentioning

confidence: 99%

Recent Trends in Surface Characterization and Chemistry with High‐Resolution Scanning Force Methods

et al. 2010

View full text Add to dashboard Cite

The current status and future prospects of non-contact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM) for studying insulating surfaces and thin insulating films in high resolution are discussed. The rapid development of these techniques and their use in combination with other scanning probe microscopy methods over the last few years has made them increasingly relevant for studying, controlling, and functionalizing the surfaces of many key materials. After introducing the instruments and the basic terminology associated with them, state-of-the-art experimental and theoretical studies of insulating surfaces and thin films are discussed, with specific focus on defects, atomic and molecular adsorbates, doping, and metallic nanoclusters. The latest achievements in atomic site-specific force spectroscopy and the identification of defects by crystal doping, work function, and surface charge imaging are reviewed and recent progress being made in high-resolution imaging in air and liquids is detailed. Finally, some of the key challenges for the future development of the considered fields are identified.

show abstract

Section: Non‐contact Atomic Force Microscopymentioning

confidence: 99%

Recent Trends in Surface Characterization and Chemistry with High‐Resolution Scanning Force Methods

et al. 2010

View full text Add to dashboard Cite

show abstract

“…In recent years, NC-AFM has became a powerful tool for imaging a wide class of materials, including metals, semi-conductors, polymers and biological materials at the atomic scale as well as detecting the tip-sample interaction force [1][2][3] . NC-AFM is desirable because it provides a tool for measuring sample topography with little or no contact between the tip and the sample.…”

Section: Introductionmentioning

confidence: 99%

Temperature Dependence Study of Noncontact Afm Images Using Molecular Dynamics Simulations

Pishkenari

Meghdari

2012

Int. J. Mod. Phys. Conf. Ser.

View full text Add to dashboard Cite

The effect of temperature on the noncontact atomic force microscopy (NC-AFM) surface imaging is investigated with the aid of molecular dynamics (MD) analysis based on the Sutton-Chen (SC) interatomic potential. Particular attention is devoted to the tip and sample flexibility at different temperatures. When a gold coated probe is brought close to the Au (001) surface at high temperatures, the tip and surface atoms are pulled together and their distance becomes smaller. The tip and sample atoms displacement varies in the different environment temperatures and this leads to the different interaction forces. Along this line, to study the effect of temperature on the resulting images, we have employed the well-known NC-AFM model and carried out realistic nonequilibrium MD 3D simulations of atomic scale imaging at different close approach positions to the surface.The environmental conditions such as moisture and temperature can have significant effects on NC-AFM images. In many applications, the fluid contaminant layer is considerably thicker than the range of the tip-sample interaction force gradient, and consequently attempts to image the true surface with NC-AFM fail. On the other hand, the environment temperature directly affects the interaction force, hysteresis, dissipated energy, and the cantilever bending (because of different top and bottom faces), and therefore it has a significant influence on the NC-AFM images. Tang et al. 4 investigated the effect of temperature and relative humidity on the patterning of a ferroelectric polymer poly (vinylidene fluoride-trifluorethylene) onto a gold substrate via dip-pen nanolithography (DPN). Recently, Roll et al. 5 reported measurements of the temperature dependence of dissipation in NC-AFM on a sample system of molecular crystallites of PTCDA on KBr. Additionally, Burke and Grutter 6 argued that the dissipation results obtained by Roll and co-authors 5 are often highly influenced by the tip structure, and the single sets of experimental data must be interpreted with caution. In a theoretical research, Trevethan et al. 7 studied the hysteresis as a function of system temperature for the MgO tip above the MgO surface at a specific distance. I another research 8 , they investigated the dependence of the dissipated energy, and the reversibility of a structural change, on the system temperature.Only a few papers can be found in literature dealing with the investigation of temperature effects on the interaction forces. For example, Kang and Kaburagi 9 carried out a theoretical analysis of the temperature effect on the interaction force between a single-atom tip and the substrate. They assumed that the temperature dependency arises from the change in phonon distribution of the substrate, and formulated the exerted force on the tip in terms of the Debye-Waller factor (DWF) within a single phonon process. Next they calculated the exerted force on the tip with several two-body potentials including Gaussian and Morse.As the main challenge of working at the nano-scale, understand...

show abstract

Investigation of the atomic-scale hysteresis in NC-AFM using atomistic dynamics

Pishkenari

Meghdari

2010

Physica E: Low-dimensional Systems and Nanostructures

View full text Add to dashboard Cite

Noncontact Atomic Force Microscopy Investigations of Au₅₅Thin Films Deposited on Gold and Graphite Substrates

Cited by 4 publications

References 10 publications

Recent Trends in Surface Characterization and Chemistry with High‐Resolution Scanning Force Methods

Recent Trends in Surface Characterization and Chemistry with High‐Resolution Scanning Force Methods

Temperature Dependence Study of Noncontact Afm Images Using Molecular Dynamics Simulations

Investigation of the atomic-scale hysteresis in NC-AFM using atomistic dynamics

Contact Info

Product

Resources

About

Noncontact Atomic Force Microscopy Investigations of Au55Thin Films Deposited on Gold and Graphite Substrates

Cited by 4 publications

References 10 publications

Recent Trends in Surface Characterization and Chemistry with High‐Resolution Scanning Force Methods

Recent Trends in Surface Characterization and Chemistry with High‐Resolution Scanning Force Methods

Temperature Dependence Study of Noncontact Afm Images Using Molecular Dynamics Simulations

Investigation of the atomic-scale hysteresis in NC-AFM using atomistic dynamics

Contact Info

Product

Resources

About

Noncontact Atomic Force Microscopy Investigations of Au₅₅Thin Films Deposited on Gold and Graphite Substrates