“…In modern deep-submicron VLSI layout other criteria often dominate the routing objectives, such as path lengths, skew, density, inductance, manufacturability, electromigration, reliability, noise, power, non-Hanan topologies, signal integrity, three-dimensionality, alternate models, and various combinations and tradeoffs of these [3,5,12,27,44,45,46,50,52,57,67,70,86].…”