Non-stoichiometry effect and disorder in Cu2ZnSnS4 thin films obtained by flash evaporation: Raman scattering investigation

Abstract

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Structural transitions of ordered kesterite-type Cu2ZnSnS4 under pressure

“…The latter is a well-established method for detecting the various types of structural disorder in this material. 14,[19][20][21][22] Even though we have not detected the proposed KS-to-ST transition, we have clearly identified a KS-to-DKS transition between 7 and 9 GPa, whereas another rocksalt-type (RS) structure was observed at about 15 GPa.…”

“…Even though the KS phase represents an ordered cationic arrangement, i.e., each cation occupies a unique Wyckoff site, cationic disorder is quite common in this material. 8,[11][12][13][14] Such a disorder can affect the photovoltaic properties of this system. For example, a mixed occupancy between Cu and Zn in the z ¼ 1/4 and z ¼ 3/4 cationic layers results in a disordered kesterite configuration (DKS, SG I 4 2 m, Z ¼ 2, Fig.…”

Towards the growth of Cu 2 ZnSn 1−x Ge x S 4 thin films by a single-stage process: Effect of substrate temperature and composition

“…This is supported by a smaller half-width and higher intensity of both A-peaks (290 and 340 cm -1 ) in the spectrum of the sample TT4 (see inset of Figure 3.c.) and it has been reported for spectra of samples with low crystal quality [28].…”

“…On the other hand, the spectra of Figure 3 show a high similarity to the fingerprint of the kesterite CZTS [27], suggesting that these samples present the same kesterite structure. The slight red shift of the dominant bands with respect to the A modes reported by [27][28] The nature of the peak at 348-349 cm -1 , following from Lorentzian fits of the most intense A-band and particularly strong for the sample after TT3, should be discussed.…”

Optimization of Cu2ZnSnS4 Absorber Layers via Sulfurization of Electrodeposited Cu-Zn-Sn Precursors for Photovoltaic Applications

“…The 514 nm wavelength was used for the identification of CZTS, CTS and CuxSy phases; for the identification of ZnS instead we used 405 nm. The semi-quantitative characterization of the amount of disordered and ordered type kesterite in the CZTS material can be achieved by analyzing some of the peaks in the Raman spectra with 514 nm and 785 nm excitation wavelength [28,99,[102][103][104]. The chemical disorder in kesterite originates from the Cu and Zn atoms at the planes at z¼ and ¾ due to the facile atomic exchange between these planes, while the other sublattices are both undisturbed [102,103].…”