Non-enumerative Generation of Path Delay Distributions and Its Application to Critical Path Selection

Smart systems are characterized by the integration in a single device of multi-domain subsystems of different technological domains, namely, analog, digital, discrete and power devices, MEMS, and power sources. Such challenges, emerging from the heterogeneous nature of the whole system, combined with the traditional challenges of digital design, directly impact on performance and on propagation delay of digital components. This article proposes a design approach to enhance the RTL model of a given digital component for the integration in smart systems with the automatic insertion of delay sensors, which can detect and correct timing failures. The article then proposes a methodology to verify such added features at system level. The augmented model is abstracted to SystemC TLM, which is automatically injected with mutants (i.e., code mutations) to emulate delays and timing failures. The resulting TLM model is finally simulated to identify timing failures and to verify the correctness of the inserted delay monitors. Experimental results demonstrate the applicability of the proposed design and verification methodology, thanks to an efficient sensor-aware abstraction methodology, by applying the flow to three complex case studies.

show abstract

Non-enumerative Generation of Path Delay Distributions and Its Application to Critical Path Selection

Cited by 2 publications

References 28 publications

Efficient Critical Path Selection Under a Probabilistic Delay Model

Efficient Critical Path Selection Under a Probabilistic Delay Model

A Cross-level Verification Methodology for Digital IPs Augmented with Embedded Timing Monitors

Contact Info

Product

Resources

About