2014
DOI: 10.1002/adfm.201400453
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Non‐Destructive Wafer Recycling for Low‐Cost Thin‐Film Flexible Optoelectronics

Abstract: Compound semiconductors are the basis for many of the highest performance optical and electronic devices in use today. Their widespread commercial application has, however, been limited due to the high cost of substrates. Device costs can be significantly reduced if the substrate is reused in a simple, totally non‐destructive and rapid process. Here, a method that allows the indefinite reuse and recycling of wafers is demonstrated, employing a combination of epitaxial “protection layers”, plasma cleaning techn… Show more

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Cited by 63 publications
(53 citation statements)
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“…9 The previously described ND-ELO method employs epitaxial protective layers grown between the sacrificial layer and the wafer that completely preserve the original wafer surface quality, even at the atomic scale, during the ELO process. 9,10 Selective removal of the protective layers using wet chemical etching eliminates the need for the chemomechanical polishing used in conventional ELO. Therefore, ND-ELO allows for the nearly indefinite reuse of the GaAs substrates, converting their cost from a material expense into a capital investment.…”
Section: Resultsmentioning
confidence: 99%
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“…9 The previously described ND-ELO method employs epitaxial protective layers grown between the sacrificial layer and the wafer that completely preserve the original wafer surface quality, even at the atomic scale, during the ELO process. 9,10 Selective removal of the protective layers using wet chemical etching eliminates the need for the chemomechanical polishing used in conventional ELO. Therefore, ND-ELO allows for the nearly indefinite reuse of the GaAs substrates, converting their cost from a material expense into a capital investment.…”
Section: Resultsmentioning
confidence: 99%
“…9,19,20 Then, the bonded sample is submerged in dilute, hot HF to lift-off etch the die in 30 min. This process takes .5 h for a 5-cm-diameter wafer using conventional ELO under similarly optimized etching conditions, corresponding to a .103 reduction in process time.…”
Section: Resultsmentioning
confidence: 99%
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