2015
DOI: 10.1016/j.mssp.2015.06.022
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Non-destructive Raman evaluation of a heavily doped surface layer fabricated by laser doping with B-doped Si nanoparticles

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Cited by 2 publications
(1 citation statement)
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“…[33][34][35] There was no formation of peaks related to other TiO 2 phases or from boron doping. Momose et al 36 observed that the addition of boron atoms as charge carriers on silicon substrates with a concentration of less than 10 19 cm À3 did not promote changes in the Raman spectra as compared to pure silicon. The addition of boron did not promote the appearance of peaks.…”
Section: Resultsmentioning
confidence: 99%
“…[33][34][35] There was no formation of peaks related to other TiO 2 phases or from boron doping. Momose et al 36 observed that the addition of boron atoms as charge carriers on silicon substrates with a concentration of less than 10 19 cm À3 did not promote changes in the Raman spectra as compared to pure silicon. The addition of boron did not promote the appearance of peaks.…”
Section: Resultsmentioning
confidence: 99%