1985
DOI: 10.1016/s0304-3991(85)80004-8
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Non-anomalous high-resolution imaging of crystalline materials

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Cited by 44 publications
(14 citation statements)
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“…Such order should lead to the appearance of kinematically forbidden 0001, I=odd precipitate reflections in diffraction patterns from precipitates, and these reflections were often found in the <110>//<lllO> selected-area diffraction patterns recorded with the high-resolution images. However, the 0001, l=odd reflections can also appear due to double diffraction in the precipitate and therefore, caution must be exercised when deciding on the origin of these reflections (Smith, Bursill andWood 1985, Howe andGronsky 1986b). In this study, CBED was used to determine whether the 0001, l=odd reflections are due to ordering or double diffraction.…”
Section: Convergent-beam Electron Diffraction Of Precipitates In a <1mentioning
confidence: 99%
“…Such order should lead to the appearance of kinematically forbidden 0001, I=odd precipitate reflections in diffraction patterns from precipitates, and these reflections were often found in the <110>//<lllO> selected-area diffraction patterns recorded with the high-resolution images. However, the 0001, l=odd reflections can also appear due to double diffraction in the precipitate and therefore, caution must be exercised when deciding on the origin of these reflections (Smith, Bursill andWood 1985, Howe andGronsky 1986b). In this study, CBED was used to determine whether the 0001, l=odd reflections are due to ordering or double diffraction.…”
Section: Convergent-beam Electron Diffraction Of Precipitates In a <1mentioning
confidence: 99%
“…It is noteworthy that these simulations were calculated for an axial illumination. The possible effect of a slight misalignment of the specimen [23] is only to emphasize such a feature as can be controled through calculations. No conclusion can be deduced about the exact nature of the polytype from such experiments.…”
mentioning
confidence: 99%
“…Off-axis misalignment results in the introduction of antisymmetric phase shifts into the TF which cause lateral displacements of image detail and the loss of any centrosymmetry otherwise present in the image (Smith, Saxton, O'Keefe, Wood & Stobbs, 1983). The problem is accentuated for materials with symmetry elements giving rise to kinematically and dynamically forbidden reflections (Smith, Bursill & Wood, 1985), like the thin crystal of futile shown in Fig. 9.…”
Section: Imaging Modesmentioning
confidence: 99%