Non-anomalous high-resolution imaging of crystalline materials

Smith, David J.; Bursill, L. A.; Wood, Geoffrey

doi:10.1016/s0304-3991(85)80004-8

Cited by 44 publications

(14 citation statements)

References 19 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Such order should lead to the appearance of kinematically forbidden 0001, I=odd precipitate reflections in diffraction patterns from precipitates, and these reflections were often found in the <110>//<lllO> selected-area diffraction patterns recorded with the high-resolution images. However, the 0001, l=odd reflections can also appear due to double diffraction in the precipitate and therefore, caution must be exercised when deciding on the origin of these reflections (Smith, Bursill andWood 1985, Howe andGronsky 1986b). In this study, CBED was used to determine whether the 0001, l=odd reflections are due to ordering or double diffraction.…”

Section: Convergent-beam Electron Diffraction Of Precipitates In a <1mentioning

confidence: 99%

Atomic mechanisms of precipitate plate growth

Howe

Dahmen

Grónsky

1987

Philosophical Magazine A

242

View full text Add to dashboard Cite

Section: Convergent-beam Electron Diffraction Of Precipitates In a <1mentioning

confidence: 99%

Atomic mechanisms of precipitate plate growth

Howe

Dahmen

Grónsky

1987

Philosophical Magazine A

242

View full text Add to dashboard Cite

“…It is noteworthy that these simulations were calculated for an axial illumination. The possible effect of a slight misalignment of the specimen [23] is only to emphasize such a feature as can be controled through calculations. No conclusion can be deduced about the exact nature of the polytype from such experiments.…”

mentioning

confidence: 99%

HREM identification of "one-dimensionally-disordered" polytypes in the SiC (CVI) matrix of SiC/SiC composites

Schamm

Mazel

Dorignac

et al. 1991

Microsc. Microanal. Microstruct.

View full text Add to dashboard Cite

Abstract. 2014 The matrix of SiC/SiC composites has been observed by electron energy loss spectroscopy (EELS) and high resolution electron microscopy (HREM) from both the chemical and the structural point of view. In this material, columnar growth and radial arrangement around the fibres of the reinforcement are typically observed for the crystal of the matrix. The ratio, Si/C = 1, of these crystals has been checked. The cubic structure of some of them has been identified through their diffraction patterns. High resolution experiments were performed to recognize the structure of the others polytypes, which are characterized by a disorder in the direction of the tetrahedral layer stacking. For this reason, they are called, "one-dimensionally-disordered" polytypes.

show abstract

“…Off-axis misalignment results in the introduction of antisymmetric phase shifts into the TF which cause lateral displacements of image detail and the loss of any centrosymmetry otherwise present in the image (Smith, Saxton, O'Keefe, Wood & Stobbs, 1983). The problem is accentuated for materials with symmetry elements giving rise to kinematically and dynamically forbidden reflections (Smith, Bursill & Wood, 1985), like the thin crystal of futile shown in Fig. 9.…”

Section: Imaging Modesmentioning

confidence: 99%

The present and future of high-resolution electron microscopy

Cowley¹,

Smith²

1987

Acta Cryst Sect A

View full text Add to dashboard Cite

High-resolution electron microscopy, with the current resolution limits of better than 2A, has been proven to be a valuable technique for the study of radiation-resistant crystals, allowing the determination of the structures of perfect crystal regions, crystal defects and crystal surfaces with atomic resolution. As the resolution is improved, however, the image contrast is increasingly determined by dynamical diffraction effects and it is increasingly sensitive to the instrumental parameters and to the geometry and alignment of the specimen. For both the conventional transmission electron microscope and the scanning transmission electron microscope, further developments should lead to better or more versatile performance, up to the limits set by the fundamental problems of radiation damage. Major advances may be expected from developments of the associated techniques of microanalysis and microdiffraction. Applications of particular interest will include studies of surfaces and interfaces, small particles and radiationinduced chemical reactions.

show abstract

Non-anomalous high-resolution imaging of crystalline materials

Cited by 44 publications

References 19 publications

Atomic mechanisms of precipitate plate growth

Atomic mechanisms of precipitate plate growth

HREM identification of "one-dimensionally-disordered" polytypes in the SiC (CVI) matrix of SiC/SiC composites

The present and future of high-resolution electron microscopy

Contact Info

Product

Resources

About