2009
DOI: 10.1109/jssc.2009.2020246
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Noise Reduction in CMOS Circuits Through Switched Gate and Forward Substrate Bias

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Cited by 19 publications
(13 citation statements)
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“…Simulation results are in accordance with data available in literature [2][3][4][5][6]9,12], indicating the validity of the proposed method. However, in order to quantitatively validate the proposed technique, experimental results are required not only to compare simulation results to measured data, but also to calibrate the trap density distribution.…”
Section: Discussionsupporting
confidence: 88%
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“…Simulation results are in accordance with data available in literature [2][3][4][5][6]9,12], indicating the validity of the proposed method. However, in order to quantitatively validate the proposed technique, experimental results are required not only to compare simulation results to measured data, but also to calibrate the trap density distribution.…”
Section: Discussionsupporting
confidence: 88%
“…2. The reduction is in accordance to the results obtained by [6], which achieved a noise reduction of about 10 dB at 1 Hz by applying FBB. Applying FBB behaves similarly to reducing the off-state voltage; it reduces the quasi Fermi level during the off-state, bringing the average quasi Fermi level closer to the middle of the silicon band gap, where the trap density is minimal, thus reducing the equivalent trap density and 1/f noise PSD.…”
Section: Nmos Invertersupporting
confidence: 91%
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“…RDF induce variability on electrical behavior that may be seen as time independent, while RTN induces fluctuations on electrical behavior which may change from one instant in time to the other [2][3][4][5][6]. These transient electrical behavior fluctuations may induce jitter in oscillators or transient failures in SRAMs [7,8].…”
Section: Introductionmentioning
confidence: 99%
“…While the RTN effects have been discussed in length by various authors [2][3][4][5][6], both in conjecture with and without RDF, only few discuss them from a circuit application perspective [9][10][11]. None of them present a framework for circuit level simulation considering the RTN source and the circuit as a coupled system, considering the interplay between RTN sources and circuit bias points, and tracking simultaneously the evolution of both RTN and circuit bias points.…”
Section: Introductionmentioning
confidence: 99%