No-fault-found and intermittent failures in electronic products

Qi, Haifeng; Ganesan, S.; Pecht, Michael

doi:10.1016/j.microrel.2008.02.003

Cited by 163 publications

(66 citation statements)

References 25 publications

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“…There are two main problems with IRFs in a real-life situation [11][12][13]. The first is the moment of occurrence, which can be any time in the future; major issue is that in worst cases it occurs rarely, and hence a very long test time is required or an online test solution has to be found.…”

Section: Detection and Datalogging Of Irfsmentioning

confidence: 99%

Intermittent Resistive Faults in Digital CMOS Circuits

Kerkhoff

Ebrahimi

2015

2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits &Amp; Systems

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Abstract-A major threat in extremely dependable high-end process node integrated systems in e.g. avionics are no failures found (NFF). One category of NFFs is the intermittent resistive fault, often originating from bad (e.g. via-or TSV-based) interconnections. This paper will show the impact of these faults on the behavior of a digital CMOS circuit via simulation. As the occurrence rate of this kind of defects can take e.g. one month, while the duration of the defect can be as short as 50 nanoseconds, to evoke and detect these faults is a huge scientific challenge. An onchip data logging system with time stamp and stored environmental conditions, along with the detection, will drastically improve the task of maintenance of avionics and reduce the current high debugging costs.

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Section: Detection and Datalogging Of Irfsmentioning

confidence: 99%

Intermittent Resistive Faults in Digital CMOS Circuits

Kerkhoff

Ebrahimi

2015

2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits &Amp; Systems

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“…Many issues of IF have been studied, including fault mechanism [4,16], depicting parameters [5,14], fault influence [7,24], fault model, fault diagnosis [19,22] and fault tolerance [3,11,12]. Sorensen [20] defined IF as any temporary deviation from nominal operating conditions of a circuit or device.…”

Section: Introductionmentioning

confidence: 99%

Intermittent fault’s parameter framework and stochastic petri net based formalization model

Shen¹,

Qiu²,

Liu³

et al. 2016

EiN

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IntermIttent fault's parameter framework and stochastIc petrI net based formalIzatIon model model parametryczny nIezdatnoścI przejścIowej oraz model formalny oparty na stochastycznej sIecI petrIego The intermittent fault widely exists in many products and brings high safety risk and maintenance cost. At present there are some different opinions on the notion of intermittent fault and there is no comprehensive parameter framework for fully describing intermittent fault. Also the formalization model which can mathematically describe intermittent fault hasn't been constructed. In this paper, the conception of intermittent fault is discussed. A new definition of intermittent fault is put forward. Then the intermittent fault's parameter framework is presented. After that, the Stochastic Petri Net (SPN) based formalization model for intermittent fault is constructed. Finally an application of the SPN formalization model is shown. The parameters for intermittent fault are computed based on the proposed model and a case study is presented. The result shows the validity of the model. The model could assist the further research such as intermittent fault diagnosis and prognostic of remaining life. Keywords: intermittent fault, parameter framework, stochastic Petri net, formalization model. Niezdatność przejściowa charakteryzuje wiele produktów i pociąga za sobą wysokie zagrożenie bezpieczeństwa oraz wysokie koszty eksploatacji. Obecnie istnieje wiele poglądów na temat pojęcia niezdatności przejściowej; nie stworzono jednak kompleksowego modelu parametrycznego pozwalającego w pełni opisać zjawisko niezdatności przejściowej. Nie skonstuowano także modelu formalnego, za pomocą którego można by opisać niezdatność przejściową w kategoriach matematycznych. W pracy omówiono koncepcję niezdatności przejściowej. Zaproponowano nową definicję tego pojęcia a następnie przedstawiono model parametryczny niezdatności przejściowej. Skonstruowano także model formalny niezdatności przejściowej oparty na stochastycznej sieci Petriego (SPN). IntroductionIntermittent fault (IF) exists in many products, including from small elements to huge complicated equipment. The frequent occurrence of intermittent fault brings on serious troubles and results in high maintenance cost and safety risk. Early in the late 1960s, Hardie [1,8] had indicated that IFs comprised over 30% of pre-delivery failures and almost 90% of field failures in computer systems. Roberts [17] figured out that up to 80 to 90% of system faults was arisen by IF in some situations. Banerjee [2] indicated that in wireless sensor networks IF was the most frequently occurring. Intermittent faults bring on many maintenance problems, such as No Fault Found (NFF), Can Not Duplicate (CND) and so on [20]. In 2012 a survey among 80 aerospace organizations ranked IF as the highest perceived cause of NFF [23]. NFF problem has been the highest cost source in aerospace maintenance. For example, the annual NFF exchange cost of the F-16 avionics boxes due to the IFs was over $20,000,000 [21,22].Ma...

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“…Although a two-way radio may meet the stipulated design requirements, intermittent or breakdown of audio communications can still occur due to degradation of materials, such as worn connection joints, broken wires, and corroded connections [3]. Loading anomalies subjected to the two-way radio can also contribute to intermittent failure, as discussed in [4,5].…”

Section: Introductionmentioning

confidence: 99%

Intermittent Audio Failure Analysis of a Remote Speaker-Microphone for a Two-Way Radio

Leong

Latiff

Yusof

et al. 2015

J Fail. Anal. and Preven.

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This paper presents a case study of an intermittent audio failure analysis of a remote speakermicrophone module for a two-way radio. A root cause analysis was undertaken to identify probable causes of the intermittent failure, followed by a series of experiments to determine the strength and the intermittent audio failure load of cable components and the fully assembled cable. The combined experimental and finite element results demonstrated that the main contributor of the intermittent audio failure was the micro surface cracks on the copper conductor strands. In addition, the combination of the component materials and design of the cable have also contributed to the non-uniform state of residual stress induced in the copper conductors which have reduced the ability of the copper conductors to withstand the normal handling load under the influence of micro surface cracks.

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No-fault-found and intermittent failures in electronic products

Cited by 163 publications

References 25 publications

Intermittent Resistive Faults in Digital CMOS Circuits

Intermittent Resistive Faults in Digital CMOS Circuits

Intermittent fault’s parameter framework and stochastic petri net based formalization model

Intermittent Audio Failure Analysis of a Remote Speaker-Microphone for a Two-Way Radio

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