“…3a, in which diffraction peaks reecting silicon were detected at 28.4 , 47.3 , 56.1 , 69.1 , and 76.4 (JCPDS# 27-1402), corresponding to the (111), ( 220), ( 311), (400), and (331) planes, and the diffraction peak representing the CNFs was at $26 . 16,17 In addition, Fe/Fe 3 C-Si@CNFs shows obvious diffraction peaks of Fe 3 C (JCPDS# 89-2867), which is the main component in the high-temperature annealing process, 39,40 and weak diffraction peaks of Fe (JCPDS# 89-7194). 32 In short, it is further demonstrated that Fe/Fe 3 C with a modied interface is successfully doped in Fe/Fe 3 C-Si@CNFs.…”