1995
DOI: 10.1143/jjap.34.3234
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Nitriding of Evaporated-Ti Thin Films by Ion Implantation

Abstract: Nitrogen ions ( N2 +) with 62 keV have been implanted into 100-nm-thick Ti films evaporated on thermally cleaned NaCl substrates. Unimplanted and N-implanted Ti films have been examined by transmission electron microscopy, Rutherford backscattering spectrometry and elastic recoil detection analysis. The analysis has provided evidence that N-implantation results in the epitaxial formation of NaCl-type TiN y and simultaneously induces the release of H fr… Show more

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Cited by 18 publications
(29 citation statements)
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“…The reflections indicated by the four-index system and the three-index system with asterisks are obtained from the hcp-Ti and TiH x crystallites, respectively. The growth of both hcp-Ti and TiH x agrees with the results of previous papers [14][15][16]: Ti films deposited on NaCl substrates spontaneously absorbed hydrogen (H) atoms from the interior of the NaCl, and then Fig. 1(a), whereas the 00 · 2 and 01 · 1 reflections in Fig.…”
Section: A Deposited Ti Thin Filmssupporting
confidence: 89%
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“…The reflections indicated by the four-index system and the three-index system with asterisks are obtained from the hcp-Ti and TiH x crystallites, respectively. The growth of both hcp-Ti and TiH x agrees with the results of previous papers [14][15][16]: Ti films deposited on NaCl substrates spontaneously absorbed hydrogen (H) atoms from the interior of the NaCl, and then Fig. 1(a), whereas the 00 · 2 and 01 · 1 reflections in Fig.…”
Section: A Deposited Ti Thin Filmssupporting
confidence: 89%
“…Detailed descriptions of the preparation method for deposited Ti films were presented in earlier papers [14,18]. The ultimate pressure of the working chamber evacuated by means of an ion pump and a Ti sublimation pump was less than 4 × 10 −9 Torr before deposition, and the pressure during deposition was 6 × 10…”
Section: Methodsmentioning
confidence: 99%
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“…The detailed descriptions of the preparation of Ti films were presented in earlier papers [18,19]. Carbon ions (C + ) of 26 keV were implanted into the deposited Ti films at an angle of 30…”
Section: Methodsmentioning
confidence: 99%
“…We focus our attention on the transformation process from the oriented hcp-Ti to preferentially oriented TiC y in the film with the dose of C, taking account of the variation of the lattice constants of hcp-Ti and TiC y . The results were also discussed with those of a self-consistent charge discrete variational (DV)-Xα molecular orbital (MO) calculation [17] and the epitaxial hcp-fcc transformation mechanism of hcp-Ti by N-implantation [18,19].…”
Section: Introductionmentioning
confidence: 99%