NI-Lab VIEW Based Automated Testing of Electronic Control Unit

Sukhesh, H. R.; Mahesh, M.

doi:10.1109/icicct.2018.8472990

Cited by 1 publication

(2 citation statements)

References 8 publications

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“…DAQ system [22], [29], [32] LabVIEW NI DAQ devices, GPIB interface, Oscilloscope, PIC microcontroller, transducer Motor control circuits DC motor driver [21] LabVIEW NI myRIO, DC motor driver Induction motor [17] LabVIEW Data acquisition (DAQ) and control Motor control [36] LabVIEW Camera, Arduino Internet of things-based products Internet of things [9], [23] LabVIEW / COTS Network switch, Oscilloscope. waveform generator Various circuits and products Printed circuit board (PCB) [5] LabVIEW PXI system, Bed of Nails (BoN) fixture Backplane [1] COTS COTS cable tester, connectors Cable assembly [33] LabVIEW NI DAQ The electronic control unit [42] LabVIEW CAN bus, Power supply GPIB based system [35] HP VEE Pro GPIB interface Microfluidic device [13] LabVIEW Camera and accessories Optical device [16] LabVIEW Data acquisition (DAQ) Power supply control [44] LabVIEW Power supply, digital multimeter, GPIB Underwater modem [11] LabVIEW Sensors, cables Thermal cycle for the unit under test [37] LabVIEW Environmental test chamber interface Temperature probe [8] COTS Analyzer, antenna Refrigerator [45] LabVIEW ATE, test jig, RS232, ADC, and sensors RF circuits and products Antenna [30] LabVIEW Arduino, Stepper motors, and drivers Antenna [6], [7] COTS Analyzer, cables RF circuit [26] LabVIEW NI PXI, Signal generator, RF current probe [38] LabVIEW Spectrum analyzer, Signal generator RF device [41] LabVIEW SPI, I2C, HPIB Software-defined radio [46] LabVIEW Signal generator, Spectrum analyzer, RS232, GPIB Wireless sensor network [18] LabVIEW Digital multimeter, Power supply, and GPIB A low-frequency signal processing system is developed by authors in [24] using LabVIEW and NI Elvis. The authors presented an automated system for electronic circuit testing in [25].…”

Section: B Review Of Existing Electronic Product Test Sitesmentioning

confidence: 99%

“…An automated test system for an RF device is presented by the author in [41] and carried out various RF tests including spurious test and automatic gain control. In [42] the authors presented a technique for automated testing for an electronic control unit using a CAN bus. The authors in [43] demonstrated the use of GPIB to automatically control and configure COTS test equipment.…”

Section: B Review Of Existing Electronic Product Test Sitesmentioning

confidence: 99%

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A Novel Process to Setup Electronic Products Test Sites Based on Figure of Merit and Machine Learning

2021

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Consumer electronic manufacturing (CEM) companies maintain a range of electronic products that are designed and tested according to the type and end-user requirements. These electronic products go through a validation and verification test for proof of design and a manufacturing test for checking reliability, quality, and manufacturing defects. Testing is carried out using test sites, designed based on the electronic product type. Currently, there is no standard approach for setting up a test site for electronic products. In this research, two processes are presented, for setting up new test sites and optimization of existing test sites for consumer and other electronic products. The proposed processes include a voice of customer (VoC) interface, that is based on a unique dataset and through machine-learning technique automatically translate customer information into customer requirements, and a figure of merit (FoM) presented as an outcome of this research using several key test-related parameters. These proposed processes are an important step towards defining a standard approach for setting test sites for consumer and other electronic products. The processes are implemented using a software application developed in LabVIEW, which is linked to a database containing test data for around 400 products collected as part of this research and form a knowledge base for the proposed processes. Finally, the processes are validated by setting up a new experimental test site for an RF receiver and optimization of an existing test site of an antenna system.INDEX TERMS Consumer electronic manufacturing (CEM), electronic product test, figure-of-merit (FoM), LabVIEW, machine-learning, voice of customer (VoC).

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