Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036)
DOI: 10.1109/pvsc.2000.916054
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Next-generation, high-efficiency III-V multijunction solar cells

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Cited by 60 publications
(28 citation statements)
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“…We observed that the performance and results produced from this virtually fabricated MJ model, is very similar to those published in King et al (2000) as well as in many other papers (Karam et al 1999;Lillington et al 2000). The results are also comparable to experimental data of similar manufactured cells.…”
Section: Validation Of Results With Experimental Datasupporting
confidence: 88%
“…We observed that the performance and results produced from this virtually fabricated MJ model, is very similar to those published in King et al (2000) as well as in many other papers (Karam et al 1999;Lillington et al 2000). The results are also comparable to experimental data of similar manufactured cells.…”
Section: Validation Of Results With Experimental Datasupporting
confidence: 88%
“…A detailed paper introducing this Novel modeling technique has been previously presented [2].The performance and results produced from the virtually fabricated MJ model, are very similar to those published in [3] as well as in many other papers [4][5][6][7]. The results are also comparable to experimental data of similarly manufactured cells, Figures 3 & 4. Minor differences are only due to the variations in the material and optical parameters used.…”
Section: Introductionsupporting
confidence: 75%
“…The GaAs middle subcell in an InGaP/GaAs/Ge 3J cell limits the overall photocurrent (i.e., has the smallest photocurrent among the three subcells) and therefore an increase of the InGaP top subcell bandgap by adding Al and increasing Al content in the AlInGaP quaternary would improve the efficiency. However addition of Al induces a significant reduction of the photocurrent of the InGaP cell probably due to the adverse effect of Al and the associated oxygen contamination on minority-carrier properties [47]. Lowering the bandgap of the current-limiting GaAs middle subcell by substituting a portion of the Ga content with In is another approach for higher efficiency than the InGaP/GaAs/Ge 3J cell, although this approach accompanies lattice mismatch and requires graded buffer layers or suffers from large density of dislocations otherwise [27,48].…”
Section: 0 Ev Bandgap Subcellsmentioning
confidence: 99%
“…A bonded GaAs/In 0.53 Ga 0. 47 As monolithic 2J cell with a lattice mismatch of 4% has been prepared, indicating potential for an InGaP/GaAs/InGaAsP/InGaAs 4J cell, as depicted in Figure 11, through bonding of an InGaP/GaAs 2J subcell and an InP-based 1eV-InGaAsP/0.73eV-InGaAs 2J subcell with the 4% lattice mismatch [60]. As a strategy to lower manufacturing costs by reusing expensive III-V semiconductor compound substrates, Ge/Si and InP/Si alternative growth substrates fabricated through wafer bonding and layer transfer of Ge and InP thin films onto Si substrates and growth of InGaP/GaAs 2J and InGaAs 1J cells on each with comparable cell efficiencies relative to cells grown on bulk Ge and InP substrates, respectively, have been demonstrated [61,62].…”
Section: 0 Ev Bandgap Subcellsmentioning
confidence: 99%