News on Silicon Drift Detectors for High Resolution EDX Imaging and Spectroscopy

Abstract

Introduced into the Energy Dispersive X-ray (EDX) Microanalysis applications more than 15 years ago, Silicon Drift Detectors (SDD) fabricated by PNDetector have established themselves as state-of-the-art detectors in many of the EDX systems used in SEMs and (S)TEMs. Over all these years we have been continuously working on improving the detector spectroscopic performance.

Reflectance Test Method of X-ray Optics on the 100-m X-ray Test Facility

“…The 100XF is equipped with a high-performance imaging pnCCD camera, Color X-ray Camera (CXC), combined with various ultra-precision attitude adjustment platforms, to complete various adjustments and imaging performance tests in the most intuitive way. Furthermore, 100XF utilizes a large-area SDD detector (approximately 10.5 mm in diameter after collimation) [11,12], which, relying on its excellent energy resolution and energy response, can use the target's bremsstrahlung spectrum to study the performance of X-ray optics, such as effective area and reflectivity, as a function of energy.…”

Improvements of portable energy dispersive X‐ray fluorescence instrument: Resolution withSilicon Drift Detector, measurements stability using pyroelectric sources, and adaptation for space use

“…For a given instrument, the resolution is the quadratic sum of the resolution of its detector and the resolution of its electronic readout. 15 In the previous years, there have been several improvements in detector resolution (i.e., semiconductor manufacturing 16 and CMOS preamplifiers 17 ) but less improvement came from the electronic readout. The main trend is to use digital electronics like DSP 18 this is promising and will allow improvements, thanks to innovative algorithms and hardware.…”