Abstract:In recent years we have seen refinement of the Si(Li) detectors for microanalysis with energy resolutions approaching theoretical limits, the reintroduction of Wavelength Dispersive Spectrometers (WDS) for specialized applications and the wealth of texture information enabled with Electron Back Scatter Diffraction (EBSD) analysis. Most recently, two new tools have made their way into the analysts' toolkit: specifically the commercial introductions of microcalorimeters and Silicon Drift Detectors (SDD). These n… Show more
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