New theoretical analysis of the LRRM calibration technique for vector network analyzers

Purroy, Francisco; Pradell, L.

doi:10.1109/19.963202

Cited by 52 publications

(31 citation statements)

References 10 publications

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“…Then, by substituting (6) and (7) into (19), the calibration Equation resulting from Lk is given as follows:…”

Section: Establishment Of the Calibration Equationmentioning

confidence: 99%

“…Then, by substituting (6) and (7) into (19), the calibration Equation resulting from L k is given as follows: (20) where the matrix [W Lk ] is fully known from measurements as shown below.…”

Section: Establishment Of the Calibration Equationmentioning

confidence: 99%

“…According to the above analysis, a two-port DUT measurement will result in a matrix Equation similar to (19). Therefore, the T-matrix of the DUT can be expressed as follows:…”

Section: Error Correction For Dut Measurementmentioning

confidence: 99%

See 2 more Smart Citations

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

Zhao

Liu²,

Wang

et al. 2017

Applied Sciences

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This paper investigates a unified theory to derive vector network analyzer calibration algorithms based on the T-matrix representation, by which means the line-reflect-match (LRM), line-reflect-match-match (LRMM), and the line-reflect-reflect-match (LRRM) calibrations are formulated. The proposed calibration theory is more general than other versions of LRM, LRMM, and LRRM in that an arbitrary known two-port device can be used as the line standard L, rather than a perfect thru or transmission line. Experimental verifications of the proposed theory using on-wafer calibrations from 0.5 GHz to 110 GHz are given.

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“…Then, by substituting (6) and (7) into (19), the calibration Equation resulting from Lk is given as follows:…”

Section: Establishment Of the Calibration Equationmentioning

confidence: 99%

Section: Establishment Of the Calibration Equationmentioning

confidence: 99%

See 1 more Smart Citation

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

Zhao

Liu²,

Wang

et al. 2017

Applied Sciences

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“…11 shows the measured S-parameters of the switch compared to the results obtained from a 2.5-D ADS-Momentum electromagnetic simulation. On-wafer measurements were performed on a Cascade Microtech Summit 9000 probe station, using the "Line-Reflect-Reflect-Match" calibration technique [33] with the calibration plane at the probe tip; then, S-parameter measurements include the effect of the access pads. The simulation strategy is shown in Fig.…”

Section: Table IV Nickel Properties Obtained From Measurementsmentioning

confidence: 99%

Electrothermally Actuated RF MEMS Switches Suspended on a Low-Resistivity Substrate

Girbau

Pradell

Lázaro

et al. 2007

J. Microelectromech. Syst.

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Abstract-This paper presents an electrothermally actuated lateral resistive-contact switch for application to low-gigahertz-band communication systems. It was manufactured on a standard low-resistivity substrate, and its RF performance was improved by suspending the structures 25 µm from the substrate, which is a strategy for future integration with active devices in the system-on-chip concept. Measured insertion losses are −0.26 dB at 1 GHz and −0.65 dB at 6 GHz, return losses are −29 dB at 1 GHz and −25 dB at 6 GHz, and isolations are −52 dB at 1 GHz and −26 dB at 6 GHz. The device is driven by a metal electrothermal actuator, which achieves large displacements and contact forces at much lower temperatures than traditional polysilicon electrothermal actuators. The RF power handling characteristics are also addressed and measured.[ 2007-0051]Index Terms-Electrothermal actuator, low-resistivity substrate, microelectromechanical systems (MEMS) switch, system on chip.

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“…Therefore we can apply 12 terms-SOLT method [3] or a least-square 8 terms SOLT method for connectorized device. LRM [2], LRRM [4], or TRL [5] …”

Section: Arbitrary Waveform Generatormentioning

confidence: 99%

A Time Domain Envelope Vectorial Network Analyzer for Non-linear Measurement Based Modeling Accounting Impedance Mismatches

Reveyrand

Soury²,

Macraigne

et al. 2006

2006 IEEE Instrumentation and Measurement Technology Conference Proceedings

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-This paper presents a measurement setup which enables power amplifier characterization driven by radio frequency modulated signals. Incident and reflected absolutes waves at both ports of the device under test can be measured even in a source pull or load pull environment. The structure and the calibration procedure of the setup are explained. Measurements examples are shown and then used in order to generate a new kind of complex envelope behavioral model. This model is taking into account both high frequency memory effect and loading impedance mismatch.

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New theoretical analysis of the LRRM calibration technique for vector network analyzers

Cited by 52 publications

References 10 publications

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

Electrothermally Actuated RF MEMS Switches Suspended on a Low-Resistivity Substrate

A Time Domain Envelope Vectorial Network Analyzer for Non-linear Measurement Based Modeling Accounting Impedance Mismatches

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