2018
DOI: 10.1038/s41598-018-21299-9
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New strategies for producing defect free SiGe strained nanolayers

Abstract: Strain engineering is seen as a cost-effective way to improve the properties of electronic devices. However, this technique is limited by the development of the Asarro Tiller Grinfeld growth instability and nucleation of dislocations. Two strain engineering processes have been developed, fabrication of stretchable nanomembranes by deposition of SiGe on a sacrificial compliant substrate and use of lateral stressors to strain SiGe on Silicon On Insulator. Here, we investigate the influence of substrate softness … Show more

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Cited by 33 publications
(27 citation statements)
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“…4. The Ge content appeared to be close to the expected one from the fabrication process [25][26][27][28] . The compressive strain in all three SiGe layers is quite strong up to ∼-0.027 for the partially condensed layer 3).…”
Section: Resultssupporting
confidence: 72%
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“…4. The Ge content appeared to be close to the expected one from the fabrication process [25][26][27][28] . The compressive strain in all three SiGe layers is quite strong up to ∼-0.027 for the partially condensed layer 3).…”
Section: Resultssupporting
confidence: 72%
“…One set of UT-SGOI substrates was obtained by following a well-established procedure [25][26][27][28] . In Fig.…”
Section: Methodsmentioning
confidence: 99%
“…The chemical potential m is the sum of the elastic energy density on the surface E and of the capillary term gk, where g is the surface energy (we neglect here the surface energy anisotropy 38 ) and k ¼ À(h xx + h yy ) is the surface local mean curvature. Given the solution (13), one nds that a modulation of wave-vector k evolves in the linear approximation as h 1 (k, t) ¼ e ik$r+st with sðk; e; hÞ ¼ A k ðe; HÞk 3 À k 4 ;…”
Section: Fourier Analysismentioning
confidence: 99%
“…In this case, the surface is not characterized by a unique wave-vector, but may be decomposed as the sum of different Fourier modes with equal amplitude at t ¼ 0 (describing a white noise). We consider only the linear regime of the surface diffusion equation (that is relevant in the smallslope approximation) where elasticity is given at rst order in h by eqn (13). Hence, the different Fourier modes evolve independently following eqn (15), starting with equal amplitude, and evolving with different growth rates.…”
Section: Real-space Analysismentioning
confidence: 99%
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