2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and 2015
DOI: 10.1109/eurosime.2015.7103122
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New simulation method for Deep Trench Termination diode (DT<sup>2</sup>) using mixed-mode TCAD sentaurus

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“…Moreover, the contacts between RFP and the electrodes should be noticed [33]. There usually is a difference between the simulation and the realistic situation in the metallization effect [34]. If the practical metallization is not performed well, an immensely increased contact resistance will reduce I RFP and impair the benefits brought by RFP.…”
Section: Simulation and Optimizationmentioning
confidence: 99%
“…Moreover, the contacts between RFP and the electrodes should be noticed [33]. There usually is a difference between the simulation and the realistic situation in the metallization effect [34]. If the practical metallization is not performed well, an immensely increased contact resistance will reduce I RFP and impair the benefits brought by RFP.…”
Section: Simulation and Optimizationmentioning
confidence: 99%