New scintillation detector of backscattered electrons for the low voltage SEM

Wandrol, Petr

doi:10.1111/j.1365-2818.2007.01782.x

Cited by 3 publications

(2 citation statements)

References 15 publications

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“…The main reason for the limited resolution has been lack of appropriate hardware. However, in recent years much progress in SEM technology has been made, especially through improved field emission guns (FEGs), column design and modern detectors, allowing high‐resolution imaging, down to the nanoscale (Jaksch et al ., 2005; Wandrol, 2007). Those improvements mainly affected standard SEM imaging of room‐temperature solid specimens.…”

Section: Introductionmentioning

confidence: 99%

Cryo‐SEM specimen preparation under controlled temperature and concentration conditions

Issman

Talmon

2012

Journal of Microscopy

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SummaryCryogenic temperature scanning electron microscopy (cryo-SEM) is an excellent technique for imaging liquid and semi-liquid materials of high vapour pressure, which are highly viscous or contain large (>0.5 μm) aggregates, in which nanometric details are to be studied. However, so far there have been no adequate tools for controlled cryospecimen preparation. The specimen preparation stage is critical, because most of those samples are very sensitive to concentration and temperature changes, leading to nanostructural artefacts in the specimens. We designed and built a system for easy and reliable cryo-SEM specimen preparation under controlled conditions of fixed temperature and humidity. We describe this new methodology, and demonstrate its applicability, by showing imaging data of three liquid material systems. We have studied carbon nanotubes (CNTs) dispersions in superacid. We also characterized a number of systems made of water/isooctane/nonionic and cationic surfactant that showed different microemulsion phases as function of the system composition and temperature. In all of the examples given, we demonstrate artefact-and contamination-free specimens, which have preserved their native nanostructure. Our new system paves the way for a new methodology for the newly emerging field of cryo-SEM.

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Section: Introductionmentioning

confidence: 99%

Cryo‐SEM specimen preparation under controlled temperature and concentration conditions

Issman

Talmon

2012

Journal of Microscopy

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“…The Everhart-Thornley detector uses a bias on the scintillator to accelerate the electrons to 10 keV (Everhart & Thornley, 1960). Similarly, an additional bias grid in front of the scintillator was proposed for BSE detection (Wandrol, 2007). A grid with additional high voltage is very effective but it adds to the complexity of the detector and the design of the entire sample chamber, and it takes more space.…”

Section: Introductionmentioning

confidence: 99%

First-Surface Scintillator for Low Accelerating Voltage Scanning Electron Microscopy (SEM) Imaging

Tzolov

Barbi²,

Bowser

et al. 2018

Microsc Microanal

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Highly luminescent thin films of zinc tungstate (ZT) have been deposited on top of conventional scintillators (Yttrium Aluminum Perovskite, Yttrium Aluminum Garnet) for electron detection in order to replace the need for a top conducting layer, such as indium tin oxide (ITO) or aluminum, which is non-scintillating and electron absorbing. Such conventional conducting layers serve the single purpose of eliminating electrical charge build-up on the scintillator. The ZT film also eliminates charging, which has been verified by measuring the Duane–Hunt limit and electron emission versus accelerating voltage. The luminescent nature of the ZT film ensures effective detection of low energy electrons from the very top surface of the structure ZT/scintillator, which we call “first-surfacescintillator”. The cathodoluminescence has been measured directly with a photodetector and spectrally resolved at different accelerating voltages. All results demonstrate the extended range of operation of the first-surface scintillator, while the conventional scintillators with a top ITO layer decline below 5 kV and have practically no output below 2 kV. Scintillators of different types were integrated in a detection system for backscattered electrons (BSE). The quality of the image at high accelerating voltages is comparable with the conventional scintillator and commercial BSE detector, while the image quality at 1 kV from the first-surface scintillator is superior.

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Measurement of local plastic strain during uniaxial reversed loading of nickel alloy 625

Atkinson

Fonseca

2020

Materials Characterization

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New scintillation detector of backscattered electrons for the low voltage SEM

Cited by 3 publications

References 15 publications

Cryo‐SEM specimen preparation under controlled temperature and concentration conditions

Cryo‐SEM specimen preparation under controlled temperature and concentration conditions

First-Surface Scintillator for Low Accelerating Voltage Scanning Electron Microscopy (SEM) Imaging

Measurement of local plastic strain during uniaxial reversed loading of nickel alloy 625

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