1993
DOI: 10.1002/pssa.2211350214
|View full text |Cite
|
Sign up to set email alerts
|

New Method of Double-Crystal X-Ray Diffractrometric Determination of the Strained State in Surface-Layer Structures

Abstract: A new method to determine the strained state in surface‐layer structures of any crystallographic system using double‐crystal X‐ray diffractometry is proposed. The possibility to calculate all six components of the strain tensor and in general case all three components of the rotation tensor is demonstrated. The strained state in ion exchanged H:LiNbO3 and Me: LiTaO3 structures is determined.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
4
0
1

Year Published

1993
1993
2006
2006

Publication Types

Select...
6
1
1

Relationship

1
7

Authors

Journals

citations
Cited by 47 publications
(5 citation statements)
references
References 31 publications
(19 reference statements)
0
4
0
1
Order By: Relevance
“…Thus, in this study, the substrate structural parameter variation created by the quenching process has been neglected. It has been shown earlier that in PE and APE waveguides on X-and Z-cuts, LN has only one non-zero component, ε 33 , of the deformation tensor in the coordinate system comprising the axes x 1 , x 2 , and x 3 , where the axis x 3 is normal to the plane of the interface and the axes x 1 and x 2 define the plane and form, together with x 3 , a right-handed orthogonal set [16]. So, PE and APE monocrystal layers are coherent with the substrate.…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…Thus, in this study, the substrate structural parameter variation created by the quenching process has been neglected. It has been shown earlier that in PE and APE waveguides on X-and Z-cuts, LN has only one non-zero component, ε 33 , of the deformation tensor in the coordinate system comprising the axes x 1 , x 2 , and x 3 , where the axis x 3 is normal to the plane of the interface and the axes x 1 and x 2 define the plane and form, together with x 3 , a right-handed orthogonal set [16]. So, PE and APE monocrystal layers are coherent with the substrate.…”
Section: Resultsmentioning
confidence: 99%
“…Moreover, for many applications, the stability of device characteristics is required for a wide temperature range. At the same time, reversible phase transitions were detected in H x Li 1−x MO 3 (M = Nb, Ta) layers over a wide range of x and temperatures by means of refractive index and [15] and [16], respectively. The vertical marks on the n axis show the n(0) values at which the formation of HTPs have not observed.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…On the same samples, from different crystallographic planes, we recorded rocking curves that we used to reconstruct the surface layer structure [14]. This work results in the crystallographic phase diagrams of the type shown in Fig.…”
Section: Phase Diagram Of Proton Exchanged Lithium Niobate Layersmentioning
confidence: 99%
“…Les guides plans ainsi obtenus ont été caractérisés par la technique du coupleur à prisme qui permet de mesurer les indices effectifs des modes à partir desquels les profils d'indice sont reconstitués en utilisant la technique IWKB [55]. Nous avons ensuite reconstitué la structure cristalline à la surface de ces mêmes échantillons en utilisant la technique des rayons X rasants pour mesurer les distances entre différents plans cristallins [56]. …”
Section: Fabrication Des Guides Dans Le Niobate Et Le Tantalate De LIunclassified