1997
DOI: 10.1116/1.589368
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New metal etching method for reducing electron shading damage

Abstract: Good quality Al/SiN x :H/InP metal-insulator-semiconductor devices obtained with electron cyclotron resonance plasma method Dry etch damage in GaAs metal-semiconductor field-effect transistors exposed to inductively coupled plasma and electron cyclotron resonance Ar plasmas J. Vac. Sci. Technol. B 15, 983 (1997); 10.1116/1.589518Effect of plasma polymerization film on reducing damage of reactive ion etched silicon substrates with CHF3+O2 plasmas J.This study proposes a new metal etching method for reducing ele… Show more

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Cited by 6 publications
(2 citation statements)
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“…The results reveal that the formation of notching at the bottom corners of Al appears to be related to the heavy boroncontaining ions, e.g., BCl 2 + or BCl 3 + in the plasma during the OE step. A possible mechanism underlying the attacking of the Al corner by heavy ions is the electron shading model [10].…”
Section: Effects Of Bcl 3 In the Oe Step On The Al Damagementioning
confidence: 99%
“…The results reveal that the formation of notching at the bottom corners of Al appears to be related to the heavy boroncontaining ions, e.g., BCl 2 + or BCl 3 + in the plasma during the OE step. A possible mechanism underlying the attacking of the Al corner by heavy ions is the electron shading model [10].…”
Section: Effects Of Bcl 3 In the Oe Step On The Al Damagementioning
confidence: 99%
“…We also found that charging damage from electron shading effect occurred at the metal-oxidesemiconductor ͑MOS͒ transistors with a comblike (line/spaceϭ1/1 m) antenna. 11 In this article, we will describe the effect of overetching gas chemistry on notching and charging in metal etching using high-density plasma. A Cl 2 /BCl 3 plasma is widely used in metal etching.…”
Section: Introductionmentioning
confidence: 99%