New in-air micro-PIXE system for biological applications

Sakai, Takuro; Oikawa, Masakazu; Sato, Takahiro; Nagamine, Takahiko; Moon, Hyun Duk; Nakazato, Kyoumi; Suzuki, Kosuke

doi:10.1016/j.nimb.2005.01.043

Cited by 51 publications

(19 citation statements)

References 5 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The proton beam was focused to a diameter of about 1 μm, which was confirmed with a secondary electron image of a copper mesh before each irradiation experiment. The beam position was controlled a PC-based system, and the scanning signals were created by two 16-bit digital-to-analog converters, two pairs of high voltage amplifiers and two pairs of electrostatic deflectors with a beam blanking system [14][15][16]. The maximum size of the writing field was 800 × 800 μm, where the beam shift given as minimum step by one bit controlling signal corresponds to 12 nm, which was sufficiently small with respect to the 1 μm diameter of the microbeam.…”

Section: Methodsmentioning

confidence: 99%

Fabrication of Micropatterns on Teflon Surface by Proton Beam Writing and Nitrogen Ion Beam Irradiation

Kitamura

Satoh

Koka

et al. 2013

Trans. Mat. Res. Soc. Japan

View full text Add to dashboard Cite

Polytetrafluoroethylene (PTFE) and fluorinated ethylene propylene (FEP) are well known as Teflon®. Synchrotron radiation and focused ion beam irradiation are effective techniques for fabricating microstructures on the surfaces of Teflon. In this study, we created micro-patterns between micro-protrusions on FEP surfaces by using a combination of 3 MeV proton beam writing (PBW) and subsequent 250 keV nitrogen ion beam irradiation. First, we found that the proton microbeam made bubbles inside FEP samples. After their samples were irradiated with the nitrogen ion beam, dense micro-protrusions were formed on the surfaces other than the upper parts above the bubbles. Instead, the parts became smooth or depressed along the patterns of PBW. Thus, a microfabrication of Teflon was demonstrated by using two different ion beam irradiation.

show abstract

Section: Methodsmentioning

confidence: 99%

Fabrication of Micropatterns on Teflon Surface by Proton Beam Writing and Nitrogen Ion Beam Irradiation

Kitamura

Satoh

Koka

et al. 2013

Trans. Mat. Res. Soc. Japan

View full text Add to dashboard Cite

show abstract

“…The beam size was estimated to be less than 1 lm in diameter from secondary electron images of a commercially available Ni mesh (1,000 mesh per inch). The proton beam writing was carried out with the resolution of approximately 3,500 9 3,500 pixels in the area of 300 9 300 lm by electrostatic deflection without using beam blanking system (Sakai et al 2002(Sakai et al , 2005van Kan et al 2001). The fluence of protons is varied from 60 to 100 nC/mm 2 (Uchiya et al 2007;van Kan et al 1999b).…”

Section: Methodsmentioning

confidence: 99%

Ni electroplating on a resist micro-machined by proton beam writing

et al. 2008

View full text Add to dashboard Cite

In this paper we report fabrication of highaspect-ratio micro-structure of Ni by electroplating, using a micro-machining technique of resists using proton beam writing (PBW) at Japan Atomic Energy Agency (JAEA). A micro-structure of 5 lm thick PMMA was fabricated by exposure using PBW at 1.7 MeV and by development. A Ni structure was then formed by electroplating on the micro-structure of PMMA. Vertical and smooth side walls observed by a scanning electron microscope (SEM) indicate that PBW can be a versatile tool for fabrication of resists and metal microstructure in combination with electroplating. The electroplated Ni structure can be used as a resolution standard, which enabled us to focus the proton beam down to 130 nm.

show abstract

“…(19) The sample was prepared on a sample holder used in in-air particle-induced X-ray emission (PIXE) analysis. (20) A powdered sample of β-SiAlON:Eu (DENKA GR-200) with a mean particle diameter of 21 μm (16) was employed for the irradiation. β-SiAlON:Eu powders were mixed with water and then homogeneously spread on a polyimide film at a thickness of approximately 7 μm.…”

Section: Preparation Of Ibil Target Of β-Sialon:eumentioning

confidence: 99%

“…β-SiAlON:Eu powders were mixed with water and then homogeneously spread on a polyimide film at a thickness of approximately 7 μm. (20) This film was attached to the sample holder for PIXE analysis and also worked as a beam extraction window for the external proton beam irradiation. To exclude the effect of auto-fluorescence from the polyimide film, another sample holder of aluminum plate was also used for the irradiation.…”

Section: Preparation Of Ibil Target Of β-Sialon:eumentioning

confidence: 99%

Ion-Beam-Induced Luminescence Analysis of β-SiAlON:Eu Scintillator under Focused Microbeam Irradiation

2016

Sensors and Materials

View full text Add to dashboard Cite

The scintillation properties and radiation durability of β-SiAlON:Eu were evaluated under focused microbeam irradiation conditions using 3 MeV protons. In situ observation of scintillation from β-SiAlON:Eu was monitored using ion-beam-induced luminescence (IBIL) and compared with that from ZnS:Ag scintillators. A comparison of the spectra of IBIL from both scintillators shows that the intensity of IBIL was analogous at different peak wavelengths of 545 nm for β-SiAlON:Eu and 450 nm for ZnS:Ag under the same irradiation conditions. Better radiation hardness towards focused proton microbeam irradiation was observed for the β-SiAlON:Eu scintillator when continuous measurements by IBIL were used. A decay constant of approximately 1.11 × 10 16 , which is two orders of magnitude higher than that for ZnS:Ag, was obtained for the β-SiAlON:Eu scintillator for focused proton microbeam irradiation. IBIL was also capable of visualizing a previously damaged area of a ZnS:Ag scintillator, which corresponds to the focused beam scanning area of 100 × 100 μm 2 . Meanwhile, the irradiated region was not significantly distinguishable from the nonirradiated region on the β-SiAlON:Eu scintillator under the same beam fluence. These results suggest that β-SiAlON:Eu could be an ideal candidate scintillator for convenient ionized particle beam monitoring and a diagnostic tool for focused and intense beam fluence conditions up to 10 16 ions/cm2.

show abstract

New in-air micro-PIXE system for biological applications

Cited by 51 publications

References 5 publications

Fabrication of Micropatterns on Teflon Surface by Proton Beam Writing and Nitrogen Ion Beam Irradiation

Fabrication of Micropatterns on Teflon Surface by Proton Beam Writing and Nitrogen Ion Beam Irradiation

Ni electroplating on a resist micro-machined by proton beam writing

Ion-Beam-Induced Luminescence Analysis of β-SiAlON:Eu Scintillator under Focused Microbeam Irradiation

Contact Info

Product

Resources

About