Neutron energy spectrum adjustment using deposited metal films on Teflon in the miniature neutron source reactor

Nassan, L.; Abdallah, B.; Omar, H.; Sarheel, A.; Alsomel, N.; Ghazi, N.

doi:10.1016/j.apradiso.2015.10.036

Applied Radiation and Isotopes

2016

DOI: 10.1016/j.apradiso.2015.10.036

|View full text |Cite

Neutron energy spectrum adjustment using deposited metal films on Teflon in the miniature neutron source reactor

L. Nassan

B. Abdallah

H. Omar

et al.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2019

2024

Publication Types

Select...

Article4

Relationship

Self Cite0

Independent4

Authors

Journals

Cited by 4 publications

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

hi@scite.ai

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Neutron energy spectrum adjustment using deposited metal films on Teflon in the miniature neutron source reactor

Cited by 4 publications

References 16 publications

Emerging Trends in Nano Structured Silicon Detectors for Neutron Spectroscopy

Emerging Trends in Nano Structured Silicon Detectors for Neutron Spectroscopy

Experimental and analytical determination of irradiated control rod worth of a low power research reactor

Ion beam measurements for the investigation of TiN thin films deposited on different substrates by vacuum arc discharge

Contact Info

Product

Resources

About