Neutron Depth Profiling Study on <sup>6</sup>Lithium and <sup>10</sup>Boron Contents of Nuclear Graphite

Lv, Shasha; Gao, Jie; Liu, Yuanyuan; Zhao, Yumeng; Cheng, J.; Li, Zhengcao

doi:10.1080/00223131.2021.1902874

Cited by 1 publication

(1 citation statement)

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“…This breakthrough not only enabled the precise monitoring of lithium variations during the battery charging and discharging processes but also facilitated a deeper understanding of the electrochemical behavior within these batteries. Subsequently, the NDP technique has been widely employed for measurements in various fields such as lithium-ion batteries, semiconductors, and nuclear materials. − …”

Section: Introductionmentioning

confidence: 99%

Measurement of Nanoscale Film Thickness Using Neutron Depth Profiling Technique

Zhao

Xiao

Yao

et al. 2023

ACS Appl. Mater. Interfaces

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Determination of geometric parameters for thin film materials has always been a critical concern in scientific research. This paper proposes a novel approach for high-resolution and nondestructive measurement of nanoscale film thickness. In this study, the neutron depth profiling (NDP) technique was employed to accurately measure the thickness of nanoscale Cu films, achieving an impressive resolution of up to 1.78 nm/keV. The measurement results exhibited a deviation from the actual thickness of less than 1%, highlighting the accuracy of the proposed method. Additionally, simulations were conducted on graphene samples to demonstrate the applicability of NDP in measuring the thickness of multilayer graphene films. These simulations provide a theoretical foundation for subsequent experimental measurements, further enhancing the validity and practicality of the proposed technique.

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