Neutron and X-ray reflectivity analysis of ceramic-metal materials

Gibaud, Alain; Sella, C.; Mâaza, M.; Sung, Li‐Piin; Dura, Joseph A.; Satija, Sushil K.

doi:10.1016/s0040-6090(98)01409-6

Cited by 11 publications

(2 citation statements)

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“…In addition, the morphology of these films may differ from one region to the next so that only a statistical approach is relevant. 5 In confined geometry, layering of particles or molecules close to interfaces has been recently reported in different systems such as liquid metals, polymer, and in molecular liquids deposited on a flat substrate. [6][7][8][9][10] In liquid metals, the layering occurs at the liquid-air interface whereas in the recent study of thin films of tetrakis ͑2-ethylhexoxy͒ silane, the layering of the molecules was found at the solid-liquid interface.…”

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Particle layering in the ceramic-metal thin filmPt−Al2O3

et al. 2001

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Experiments performed by x-ray reflectivity, grazing incidence small angle x-ray scattering ͑GISAXS͒, and transmission electron microscopy ͑TEM͒ on a cosputtered nanocermet thin film of Pt-Al 2 O 3 are presented. It is shown that the morphology of such a heterogeneous material can be well interpreted by combining the information obtained from the three techniques. In particular, the layering of metal nanoparticles in the immediate vicinity of the substrate is clearly evidenced. GISAXS results are interpreted via a model which yields spherical nanoparticles of diameter 2Rϭ3.1 nm, separated on the average by a distance of 5.8 nm. The evidence for the layering of particles close to the substrate is deduced from the analysis of the specular reflectivity and probed directly by TEM.

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Particle layering in the ceramic-metal thin filmPt−Al2O3

et al. 2001

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“…The critical thickness of the amorphous layer is estimated in the level less than 3 nm. Gibaud et al . measured the structure along to the surface normal for ceramic–metal thin films of Pt/Al 2 O 3 by neutron reflectometry and obtained a certain periodicity that consists of blocks of Pt 28 Å thick separated by an average distance of 53 Å.…”

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Neutron reflectometry study of CrAlN/TiAlN nanostructured multilayers

Wang

et al. 2016

Surface & Interface Analysis

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Alternate CrAlN/TiAlN multilayers with different repeated bilayer thickness ranging from 10 to 20 nm were prepared by sputtering Ti, Al and Cr targets with N 2 and Ar gases. The interface structures of multilayers such as the average individual thicknesses, the scattering length densities and interface roughness were characterized using nonpolarized specular neutron reflectometry. The experimental reflectivity can be well described by a multilayer model for all samples. The individual thickness in the repeated bilayers is close to the nominal thickness. The interface roughness diminishes as the thickness of the bilayer in mutilayers decreases. The asymmetric interface roughness on CrAlN-TiAlN-Si interfaces causes the larger interface roughness of CrAlN on TiAlN interface. The scattering length density profiles of multilayers suggest that the chemical composition is approximate to Cr 0.86 Al 0.14 N/Ti 0.5 Al 0.5 N and which is more accurate for thinner films.

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Crystallization behavior of PZT film prepared by sol–gel route

Yang

Wang

et al. 2006

J Mater Sci

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Neutron and X-ray reflectivity analysis of ceramic-metal materials

Cited by 11 publications

References 6 publications

Particle layering in the ceramic-metal thin filmPt−Al2O3

Particle layering in the ceramic-metal thin filmPt−Al2O3

Neutron reflectometry study of CrAlN/TiAlN nanostructured multilayers

Crystallization behavior of PZT film prepared by sol–gel route

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