2017
DOI: 10.1109/led.2017.2672967
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Negative Capacitance FinFET With Sub-20-mV/decade Subthreshold Slope and Minimal Hysteresis of 0.48 V

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Cited by 105 publications
(57 citation statements)
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“…Through the addition of a suspended metal membrane to the solid-state MOS transistor, SG-MOSFETs achieve the reduced SS. [86,87] Moreover, to achieve superior electric performance, they can be combined with other FETs, such as 2DFETs, [88][89][90] FinFETs, [61,62] and TFETs. [20] However, complicated processes in fabrication and the problem of reliability limit the practical application of these devices.…”
Section: Ncfet To the Rescuementioning
confidence: 99%
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“…Through the addition of a suspended metal membrane to the solid-state MOS transistor, SG-MOSFETs achieve the reduced SS. [86,87] Moreover, to achieve superior electric performance, they can be combined with other FETs, such as 2DFETs, [88][89][90] FinFETs, [61,62] and TFETs. [20] However, complicated processes in fabrication and the problem of reliability limit the practical application of these devices.…”
Section: Ncfet To the Rescuementioning
confidence: 99%
“…[129,130] In 2015, a combination of the FinFET and NCFET structures termed NC-FinFET was proposed and experimentally verified to exhibit an SS of 55 mV dec −1 . [50,[61][62][63][64]131,132] Figure 9a,b presents the structure and test results of a relatively early NC-FinFET. [50,[61][62][63][64]131,132] Figure 9a,b presents the structure and test results of a relatively early NC-FinFET.…”
Section: Nc-finfetmentioning
confidence: 99%
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“…In the near future, it is necessary to design the optimal ferroelectric capacitor in terms of the CMOS-compatible material and/or its thickness, and thereafter, the sub-60-mV/decade steep switching and hysteresis-free NCFET can be implemented. (2) The capacitance of baseline device can be appropriately controlled for hysteresis-free operation [ 20 , 26 , 37 ]. In this case, the device parameters that can be adjusted would be varied depending on the device architecture of baseline device.…”
Section: Negative (Differential) Capacitance Field Effect Transistor mentioning
confidence: 99%
“…As mentioned before, the exploratory study on NCFET has begun in 2008. Afterwards, many works have been followed, such as (i) the verification work of negative capacitance phenomenon and the steep switching effect [ 11 18 ], (ii) the engineering work to control the hysteresis window [ 20 , 26 , 37 ], (iii) the work for compatibility to current CMOS processes [ 38 – 45 ], (iv) experimental and theoretical studies of capacitance-matching conditions required for stable and reliable operation [ 53 , 54 ], and (v) modelling for circuit designs [ 55 60 ]. Many studies have supported how to adopt NCFET as future ultra-low power logic transistor.…”
Section: Negative (Differential) Capacitance Field Effect Transistor mentioning
confidence: 99%