Near-Infrared Spectroscopic Study of Chlorite Minerals

Yang, Min; Ye, Meifang; Han, Haihui; Ren, Guangli; Han, Ling; Zhang, Zhuan

doi:10.1155/2018/6958260

Cited by 18 publications

(11 citation statements)

References 35 publications

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“…This observation is supported by the weak band at 7065 cm –1 in the NIR spectra, attributed to the 2ʋAl 2 OH vibration of kaolinite (Petit et al , 1999). In addition, the band at 4525 cm –1 corresponds to the combination of the 2δAl 2 OH and 2ʋAl 2 OH vibrations of kaolinite and/or chlorite (Yang et al , 2018). The presence of chlorite might be verified by the presence of two diagnostic bands at 4280 and 4440 cm –1 .…”

Section: Resultsmentioning

confidence: 99%

Mineralogical and crystal-chemical characterization of the talc ore deposit of Minzanzala, Gabon

et al. 2019

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This research aims to characterize the mineralogical and crystal-chemical purity of two samples of natural talc (BTT6, BTT7) from the occurrence ‘Ecole1’ in the deposit of Minzanzala, southwest Gabon. X-ray diffraction and modal-composition calculations demonstrated the presence of quartz and Al–Fe-bearing phases (kaolinite and/or chlorite and/or Al–Fe oxyhydroxides) as accessory minerals in both ores. In contrast, the chemical and spectroscopic characterization of the talc component revealed remarkable chemical purity expressed by very low Fe contents. According to these results, the talc of Minzanzala might be used as a filler in a wide range of industrial applications, such as in cosmetics, paints, polymers or ceramics.

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Section: Resultsmentioning

confidence: 99%

Mineralogical and crystal-chemical characterization of the talc ore deposit of Minzanzala, Gabon

et al. 2019

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“…According to Shi et al (2018), spectral characteristics of glaucophane can be identified in the NIR region and consequently the blueschist metamorphism can be recognized. Yang et al (2018) described that the wavelength position of the absorption features of chlorites are correlated with the Fe/ (Fe +Mg) values. More specifically, the two diagnostic absorption features of chlorites i.e.…”

Section: Discussionmentioning

confidence: 99%

Application of Near-Infrared Spectroscopy for the identification of rock mineralogy from Kos Island, Aegean Sea, Greece

Kokkaliari

Iliopoulos

2020

geosociety

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Near-Infrared spectroscopy (NIR) is a useful tool for direct and on-site identification of rock mineralogy in spite of the difficulties arising in spectral evaluation, due to limited availability of spectral libraries at the time. Especially in the field, a functional methodology for the identification and evaluation if possible, of the geologic materials, is of interest to many researchers. However, several different parameters (such as grain size, color, mineralogy, texture, water content etc.) can affect the spectroscopic properties of the samples resulting in spectral variability. The subject of the present work focuses in various lithotypes (monzodiorite, diorite, altered diorite, actinolite schist, cataclasite, slate) from Kos Island, Aegean Sea, in Greece, all bearing hydrous minerals in various amounts. The evaluation of the results obtained from NIR spectroscopy offered important qualitative information about the mineralogy of the lithotypes examined. The important asset of the method is that no sample preparation was necessary. From the reflectance spectra, the NIR-active minerals that were identified include chlorite, micas, amphiboles and epidotes. Petrographic and mineralogic analyses were also employed in order to confirm the NIR results and provide more detailed information about the mineralogy of the samples, the grain size and the orientation of the minerals. Correlation of wavelength positions at ~1400 nm with loss on ignition (LOI) values led us to relate the various lithotypes in terms of their petrological affinities. NIR spectroscopy was proved to be a useful tool, especially for the mineralogic identification of rocks underwent low- to medium grade metamorphism, from greenschist to amphibolite facies.

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“…The intensity of an absorption band in FTIR spectra depends on the number of the specific bonds present [45].…”

Section: Ft-ir Characterizationmentioning

confidence: 99%

Magnetron sputtering technique for analyzing the influence of RF sputtering power on microstructural surface morphology of aluminum thin films deposited on SiO2/Si substrates

et al. 2021

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In this research, aluminum (Al) thin films were deposited on SiO2/Si substrates using RF magnetron sputtering technique for analyzing the influence of RF sputtering power on microstructural surface morphologies. Different sputtering RF powers (100–400 W) were employed to form Al thin films. The characteristics of deposited Al thin films are investigated using X-ray diffraction pattern (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and Fourier-transforms infrared (FTIR) spectroscopy. The X-ray diffraction (XRD) results demonstrate that the deposited films in low sputtering power have amorphous nature. By increasing the sputtering power, crystallization is observed. AFM analysis results show that the RF power of 300 W is the optimum sputtering power to grow the smoothest Al thin films. FTIR results show that the varying RF power affect the chemical structure of the deposited films. The SEM results show that by increasing the sputtering power leads to the formation of isolated texture on the surface of substrate. In conclusion, RF power has a significant impact on the properties of deposited films, particularly crystallization and shape.

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Near-Infrared Spectroscopic Study of Chlorite Minerals

Cited by 18 publications

References 35 publications

Mineralogical and crystal-chemical characterization of the talc ore deposit of Minzanzala, Gabon

Mineralogical and crystal-chemical characterization of the talc ore deposit of Minzanzala, Gabon

Application of Near-Infrared Spectroscopy for the identification of rock mineralogy from Kos Island, Aegean Sea, Greece

Magnetron sputtering technique for analyzing the influence of RF sputtering power on microstructural surface morphology of aluminum thin films deposited on SiO2/Si substrates

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