Near-Field Microwave Microscopy for Nanoscience and Nanotechnology

Lee, Kiejin; Melikyan, Harutyun; Babajanyan, Arsen; Friedman, Barry

doi:10.1007/978-3-642-10497-8_5

Cited by 10 publications

(7 citation statements)

References 68 publications

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“…Such a deep minimum gives a NSMM with high sensitivity and resolution. 3 In practice, this matching is obtained by adjusting the position of dielectric resonator in the cavity by adjusting the post height. A micrometer is attached to the bottom of the post to do this adjustment.…”

Section: Results Of the Fem Modelmentioning

confidence: 99%

“…In particular, microwaves, are currently being used for probing a wide variety of materials, in the near-field regime. 2,3 For example, Lee and collaborators have designed a near-field scanning microwave microscope (NSMM) with better than micron resolution. 4 Such devices are also commercially available, for example, the Agilent AFM with the scanning microwave microscopy mode.…”

Section: Introductionmentioning

confidence: 99%

“…[6][7][8] Such information is potentially practically useful in the semiconductor 9 and biotechnology industries. 3 However, the most natural observable for the NSMM, the microwave reflection coefficient S 11 is not straight forward to interpret in terms of material properties, i.e., the local dielectric constant and the local conductivity of the sample. Moreover, given the measurement system and the sample properties, it is not easy to calculate S 11 versus driving frequency.…”

Section: Introductionmentioning

confidence: 99%

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A three-dimensional finite element model of near-field scanning microwave microscopy

Balusek

Friedman

Luna

et al. 2012

Journal of Applied Physics

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Enhanced microwave absorption in columnar structured magnetic materials J. Appl. Phys. 112, 083908 (2012) Terahertz emission from cubic semiconductor induced by a transient anisotropic photocurrent J. Appl. Phys. 112, 073115 (2012) Resonant plasmonic effects in periodic graphene antidot arrays Appl. Phys. Lett. 101, 151119 (2012) Room temperature terahertz polariton emitter Appl. Phys. Lett. 101, 141118 (2012) Optical parameters of ZnTe determined using continuous-wave terahertz radiation A three-dimensional finite element model of an experimental near-field scanning microwave microscope (NSMM) has been developed and compared to experiment on non conducting samples. The microwave reflection coefficient S 11 is calculated as a function of frequency with no adjustable parameters. There is qualitative agreement with experiment in that the resonant frequency can show a sizable increase with sample dielectric constant; a result that is not obtained with a two-dimensional model. The most realistic model shows a semi-quantitative agreement with experiment. The effect of different sample thicknesses and varying tip sample distances is investigated numerically and shown to effect NSMM performance in a way consistent with experiment. Visualization of the electric field indicates that the field is primarily determined by the shape of the coupling hooks. V C 2012 American Institute of Physics.

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Section: Results Of the Fem Modelmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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A three-dimensional finite element model of near-field scanning microwave microscopy

Balusek

Friedman

Luna

et al. 2012

Journal of Applied Physics

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“…For the distances that many SMM instruments are designed for, the AFM/STM communities have already done an excellent job of robustly solving this positioning problem. In the case of the AFM cantilever, the very rapid change in the repulsive force that the tip undergoes when in contact with the surface of the sample is amplified and monitored through a deflection of the cantilever beam and the subsequent displacement of a reflected laser that tracks the angle of the cantilever with respect to the surface [35]. For the STM, the tunneling current amplitude (assuming the sample is conductive) is extremely sensitive to the distance of the tip above the sample and can be tracked and kept constant with an appropriate feedback loop to the vertical controller [34].…”

Section: A Smm-vnamentioning

confidence: 99%

Microwaves Are Everywhere: “SMM: Nano-Microwaves”

Siegel

2021

IEEE J. Microw.

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If the Twentieth Century boasted of the Space Age and the Computer Age, the Twenty-First Century is certainly starting off with the Age of Biology, or at least Biochemistry. The enormous impact of CRISPR (clustered regularly interspaced short palindromic repeats), LAMP (loop-mediated isothermal amplification), cryo-EM (electron microscopy), and many other nano-techniques in the biosciences is transforming the world in so many ways, not the least of which are the diagnostic tests and vaccines that are helping our global pandemic. Microwaves are huge compared to the likes of optical wavelengths and, at least for the world of bio-spectroscopy, being able to perform and take advantage of standard microwave materials measurements at a cellular (micron) and even molecular (nanometer) scale has been a major impediment to applications for this well-developed electronics technology and instrumentation. In the early part of the 21 st Century, the fields of AFM (atomic force microscopy) and SMM (scanning microwave microscopy) came together and spun off a handful of commercial applications and instruments stimulated by some very clever engineering and bio researchers and partnerships. In this, our fourth tutorial article in our continuing series on the ubiquitous presence and applications of microwaves, we take a look at the origins, instruments, biological applications, and goals for "nano-microwaves" the use of microwaves at nanometer scales.INDEX TERMS Scanning microwave microscopy (SMM-VNA), THz near-field scattering microscopy (SMM-THz), near-field microwave imaging, near-field THz spectroscopy, nano-microwaves.This article has been accepted for inclusion in a future issue of this journal. Content is final as presented, with the exception of pagination.

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“…A near-field scanning microwave microprobe (NSMM) is a useful technique to characterize the conductivity of material nondestructively with noncontact and provides high resolution up to a few tens of nm. 15,16 The NSMM uses a single probe for pumping and detecting a microwave signal, simultaneously, and characterizes a material conductivity by measuring a change of the reflected microwave power. However, because the probe typically used in the NSMM is isotropic, an anisotropic conductivity of a material cannot be characterized.…”

Section: Introductionmentioning

confidence: 99%

Characterization of anisotropic electrical conductivity of carbon fiber composite materials by a microwave probe pumping technique

Lee

Galstyan

Babajanyan

et al. 2015

Journal of Composite Materials

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Characterization of anisotropic conductivity of thin carbon fiber/poly ether ether ketone (PEEK) composite was investigated by noncontact and nondestructive microwave probe pumping (MPP) technique. The microwave was pumped by a coaxial probe, and the pumped field intensity distribution was measured by a near-field scanning microwave microprobe (NSMM) and a thermography camera. From the measurement and simulation results, it was observed that intensity of the electromagnetic field was higher along the high conductive directions due to the larger eddy current along these directions. Additionally, electrical defect detection by pumping probe technique was investigated. It was observed that the field intensity drastically decreased around the electrical defect. We showed that through an anisotropic field distribution around the pumping probe, an electrical defect of a carbon fiber/PEEK composite can be detected by combination of MPP and NSMM techniques.

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Near-Field Microwave Microscopy for Nanoscience and Nanotechnology

Cited by 10 publications

References 68 publications

A three-dimensional finite element model of near-field scanning microwave microscopy

A three-dimensional finite element model of near-field scanning microwave microscopy

Microwaves Are Everywhere: “SMM: Nano-Microwaves”

Characterization of anisotropic electrical conductivity of carbon fiber composite materials by a microwave probe pumping technique

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